Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

Inoue, Takato; Matsuyama, Satoshi; Kawai, Shogo; Yumoto, Hirokatsu; Inubushi, Yuichi; Osaka, Taito; Inoue, Ichiro; Koyama, Takahisa; Tono, Kensuke; Ohashi, Haruhiko; Yabashi, Makina; Ishikawa, Tetsuya; Yamauchi, Kazuto

doi:https://doi.org/10.1063/1.5026440

Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

Inoue, Takato; Matsuyama, Satoshi; Kawai, Shogo et al.

Review of Scientific Instruments, 2018, 89(4), 043106

アクセス数:229件（2025-03-19 01:28 集計）

固定URL: https://hdl.handle.net/11094/86965

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タイトル	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
著者	著者名 Inoue, Takato
	NRID 1000010423196 1000010423196 著者名 Matsuyama, Satoshi
	著者名 Kawai, Shogo
	NRID 1000020423197 1000020423197 著者名 Yumoto, Hirokatsu
	NRID 1000040506250 1000040506250 著者名 Inubushi, Yuichi
	NRID 1000070782887 1000070782887 著者名 Osaka, Taito
	NRID 1000030783401 1000030783401 著者名 Inoue, Ichiro
	NRID 1000020468276 1000020468276 著者名 Koyama, Takahisa
	NRID 1000000353508 1000000353508 著者名 Tono, Kensuke
	NRID 1000030443550 1000030443550 著者名 Ohashi, Haruhiko
	NRID 1000000372144 1000000372144 著者名 Yabashi, Makina
	NRID 1000080159699 1000080159699 著者名 Ishikawa, Tetsuya
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 著者名 Yamauchi, Kazuto
内容	Takato Inoue, Satoshi Matsuyama, Shogo Kawai, Hirokatsu Yumoto, Yuichi Inubushi, Taito Osaka, Ichiro Inoue, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi, "Systematic-error-free wavefront measurement using an X-ray single-grating interferometer", Review of Scientific Instruments 89, 043106 (2018), https://doi.org/10.1063/1.5026440.
抄録	In this study, the systematic errors of an X-ray single-grating interferometer based on the Talbot effect were investigated in detail. Non-negligible systematic errors induced by an X-ray camera were identified and a method to eliminate the systematic error was proposed. Systematic-error-free measurements of the wavefront error produced by multilayer focusing mirrors with large numerical apertures were demonstrated at the SPring-8 Angstrom Compact free electron LAser. Consequently, wavefront aberration obtained with two different cameras was found to be consistent with an accuracy better than λ/12.
出版者	American Institute of Physics
収録物名	Review of Scientific Instruments
巻(号)	89(4)
ページ	043106
刊行年月	2018-04-26
言語	英語
ハンドルURL	https://hdl.handle.net/11094/86965
PISSN	00346748
eISSN	10897623
NCID	AA00817730
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1063/1.5026440
関連情報 (isIdenticalTo)	PMID 29716372
アクセス権	open access
権利情報	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.5026440.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Review of Scientific Instruments. 2018, 89(4), p. 043106
DC.title	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
DC.creator	Inoue, Takato
	Matsuyama, Satoshi
	Kawai, Shogo
	Yumoto, Hirokatsu
	Inubushi, Yuichi
	Osaka, Taito
	Inoue, Ichiro
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yabashi, Makina
	Ishikawa, Tetsuya
	Yamauchi, Kazuto
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2018-04-26
DC.identifier	https://doi.org/10.1063/1.5026440
DC.description	Takato Inoue, Satoshi Matsuyama, Shogo Kawai, Hirokatsu Yumoto, Yuichi Inubushi, Taito Osaka, Ichiro Inoue, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi, "Systematic-error-free wavefront measurement using an X-ray single-grating interferometer", Review of Scientific Instruments 89, 043106 (2018), https://doi.org/10.1063/1.5026440.
DCTERMS.abstract	In this study, the systematic errors of an X-ray single-grating interferometer based on the Talbot effect were investigated in detail. Non-negligible systematic errors induced by an X-ray camera were identified and a method to eliminate the systematic error was proposed. Systematic-error-free measurements of the wavefront error produced by multilayer focusing mirrors with large numerical apertures were demonstrated at the SPring-8 Angstrom Compact free electron LAser. Consequently, wavefront aberration obtained with two different cameras was found to be consistent with an accuracy better than λ/12.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.5026440.
DC.format	86965
citation_title	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
citation_author	Inoue, Takato
	Matsuyama, Satoshi
	Kawai, Shogo
	Yumoto, Hirokatsu
	Inubushi, Yuichi
	Osaka, Taito
	Inoue, Ichiro
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yabashi, Makina
	Ishikawa, Tetsuya
	Yamauchi, Kazuto
citation_publisher	American Institute of Physics
citation_language	英語
citation_date	2018-04-26
citation_journal_title	Review of Scientific Instruments
citation_volume	89
citation_issue	4
citation_firstpage	043106
citation_doi	https://doi.org/10.1063/1.5026440
citation_pmid	29716372
citation_public_url	https://hdl.handle.net/11094/86965

Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

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