Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer

Xia, Mingqian; Hayashi, Takahiro; Mori, Naoki

doi:https://doi.org/10.1016/j.ndteint.2024.103316

Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer

Xia, Mingqian; Hayashi, Takahiro; Mori, Naoki

NDT and E International, 2025, 151, 103316

アクセス数:301件（2025-08-15 23:02 集計）

固定URL: https://hdl.handle.net/11094/100389

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タイトル	Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer
著者	著者名 Xia, Mingqian
	NRID 1000030324479 1000030324479 ORCID 0000-0001-6064-4658 0000-0001-6064-4658 researchmap permalink takahiro_hayashi takahiro_hayashi Scopus Author ID 37064150200 37064150200 著者名 Hayashi, Takahiro
	NRID 1000000802092 1000000802092 ORCID 0000-0002-0707-3443 0000-0002-0707-3443 researchmap permalink 7000020478 7000020478 Scopus Author ID 55614094500 55614094500 著者名 Mori, Naoki
キーワード等	Defect imaging
	Lamb wave
	Phased array
	Ultrasonic
	Waveguide
内容	Xia M., Hayashi T., Mori N. Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer. NDT and E International 151, 103316 (2025); https://doi.org/10.1016/j.ndteint.2024.103316.
抄録	The authors have previously validated defect imaging using stacked plate buffer and a phased array probe by numerical simulations. This study experimentally verifies the feasibility of this approach. A stacked plate buffer created by considering the dispersion of the S0 mode of Lamb waves was used for the first experiments, which showed that high intensity spurious areas appeared and defect images were blurred. Numerical analysis of the propagation of S0 modes in the plate revealed that trailing waves cause the high intensity spurious areas. Theoretical and numerical analyses indicated that the trailing waves can be removed by increasing the width of the plate. Finally, experiments using wider plates verified that a phased array probe with a stacked plate buffer can eliminate the high intensity spurious areas and clarify the defect images.
出版者	Elsevier Ltd
収録物名	NDT and E International
巻(号)	151
ページ	103316
刊行年月	2025-04-01
言語	英語
ハンドルURL	https://hdl.handle.net/11094/100389
PISSN	09638695
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1016/j.ndteint.2024.103316
アクセス権	open access
権利情報	This article is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCTERMS.bibliographicCitation	NDT and E International. 2025, 151, p. 103316
DC.title	Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer
DC.creator	Xia, Mingqian
	Hayashi, Takahiro
	Mori, Naoki
DC.publisher	Elsevier Ltd
DC.language' scheme='DCTERMS.RFC1766	英語
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2025-04-01
DC.identifier	https://doi.org/10.1016/j.ndteint.2024.103316
DC.subject	Defect imaging
	Lamb wave
	Phased array
	Ultrasonic
	Waveguide
DC.description	Xia M., Hayashi T., Mori N. Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer. NDT and E International 151, 103316 (2025); https://doi.org/10.1016/j.ndteint.2024.103316.
DCTERMS.abstract	The authors have previously validated defect imaging using stacked plate buffer and a phased array probe by numerical simulations. This study experimentally verifies the feasibility of this approach. A stacked plate buffer created by considering the dispersion of the S0 mode of Lamb waves was used for the first experiments, which showed that high intensity spurious areas appeared and defect images were blurred. Numerical analysis of the propagation of S0 modes in the plate revealed that trailing waves cause the high intensity spurious areas. Theoretical and numerical analyses indicated that the trailing waves can be removed by increasing the width of the plate. Finally, experiments using wider plates verified that a phased array probe with a stacked plate buffer can eliminate the high intensity spurious areas and clarify the defect images.
DC.rights	This article is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
DC.format	100389
citation_title	Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer
citation_author	Xia, Mingqian
	Hayashi, Takahiro
	Mori, Naoki
citation_publisher	Elsevier Ltd
citation_language	英語
citation_date	2025-04-01
citation_journal_title	NDT and E International
citation_volume	151
citation_firstpage	103316
citation_doi	https://doi.org/10.1016/j.ndteint.2024.103316
citation_public_url	https://hdl.handle.net/11094/100389

Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer

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