Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact

Jansen, R.; Spiesser, A.; Fujita, Y.; Saito, H.; Hamaya, K.; Yuasa, S.

doi:https://doi.org/10.1103/physrevb.107.024411

Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact

Jansen, R.; Spiesser, A.; Fujita, Y. et al.

Physical Review B, 2023, 107(2), 024411

アクセス数:90件（2025-08-28 18:25 集計）

固定URL: https://hdl.handle.net/11094/101977

閲覧可能ファイル

ファイル	フォーマット	利用条件	サイズ	閲覧回数	利用開始日	説明	information
PhysRevB_107_2	pdf	なし	568 KB	11	2025.06.26

論文情報

ファイル出力 EndNote Basic出力 Mendeley出力

タイトル	Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact
著者	NRID 1000040600250 1000040600250 著者名 Jansen, R.
	NRID 1000090793513 1000090793513 著者名 Spiesser, A.
	著者名 Fujita, Y.
	NRID 1000050357068 1000050357068 著者名 Saito, H.
	NRID 1000090401281 1000090401281 ORCID 0000-0002-5473-6086 0000-0002-5473-6086 researchmap permalink read0102192 read0102192 Scopus Author ID 9244846800 9244846800 著者名 Hamaya, K.
	著者名 Yuasa, S.
内容	Jansen R., Spiesser A., Fujita Y., et al. Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact. Physical Review B 107, 024411 (2023); https://doi.org/10.1103/physrevb.107.024411.
抄録	The scaling of the proximity exchange field, which ferromagnetic Fe exerts on the spin accumulation at the MgO/Si interface of Fe/MgO/Si tunnel contacts, was investigated using the inverted Hanle effect. Data as a function of the applied bias voltage shows that the exchange field varies with bias in the same way as the square of the tunnel spin polarization (TSP). The decay of the exchange field with increasing MgO thickness tMgO is rather weak and nonexponential, which we argue to be related to the improved epitaxial quality of the MgO, and the, consequently, improved spin-filtering properties at larger MgO thickness. Using the TSP data to correct for this yields an exponential decay of the exchange field with tMgO with a decay length of λ=-0.42 nm. Comparing this to the decay length for the tunnel conductance (λ=-0.21 nm) suggests that the exchange interaction is dominated by two-step tunneling processes.
出版者	American Physical Society
収録物名	Physical Review B
巻(号)	107(2)
ページ	024411
刊行年月	2023-01-12
言語	英語
ハンドルURL	https://hdl.handle.net/11094/101977
PISSN	24699950
eISSN	24699969
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1103/physrevb.107.024411
アクセス権	open access
権利情報	© 2023 American Physical Society.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Physical Review B. 2023, 107(2), p. 024411
DC.title	Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact
DC.creator	Jansen, R.
	Spiesser, A.
	Fujita, Y.
	Saito, H.
	Hamaya, K.
	Yuasa, S.
DC.publisher	American Physical Society
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2023-01-12
DC.identifier	https://doi.org/10.1103/physrevb.107.024411
DC.description	Jansen R., Spiesser A., Fujita Y., et al. Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact. Physical Review B 107, 024411 (2023); https://doi.org/10.1103/physrevb.107.024411.
DCTERMS.abstract	The scaling of the proximity exchange field, which ferromagnetic Fe exerts on the spin accumulation at the MgO/Si interface of Fe/MgO/Si tunnel contacts, was investigated using the inverted Hanle effect. Data as a function of the applied bias voltage shows that the exchange field varies with bias in the same way as the square of the tunnel spin polarization (TSP). The decay of the exchange field with increasing MgO thickness tMgO is rather weak and nonexponential, which we argue to be related to the improved epitaxial quality of the MgO, and the, consequently, improved spin-filtering properties at larger MgO thickness. Using the TSP data to correct for this yields an exponential decay of the exchange field with tMgO with a decay length of λ=-0.42 nm. Comparing this to the decay length for the tunnel conductance (λ=-0.21 nm) suggests that the exchange interaction is dominated by two-step tunneling processes.
DC.rights	© 2023 American Physical Society.
DC.format	101977
citation_title	Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact
citation_author	Jansen, R.
	Spiesser, A.
	Fujita, Y.
	Saito, H.
	Hamaya, K.
	Yuasa, S.
citation_publisher	American Physical Society
citation_language	英語
citation_date	2023-01-12
citation_journal_title	Physical Review B
citation_volume	107
citation_issue	2
citation_firstpage	024411
citation_doi	https://doi.org/10.1103/physrevb.107.024411
citation_public_url	https://hdl.handle.net/11094/101977

Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact

閲覧可能ファイル

論文情報

論文詳細を表示