Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current

Hirose, Tetsuya; Yoshimura, Ryuji; Ido, Toru; Matsuoka, Toshimasa; Taniguchi, Kenji

Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current

Hirose, Tetsuya; Yoshimura, Ryuji; Ido, Toru et al.

IEICE Transactions on Electronics, 2004, E87-C(11), 1910-1914

アクセス数:282件（2025-08-14 22:14 集計）

固定URL: https://hdl.handle.net/11094/51705

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タイトル	Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current
著者	著者名 Hirose, Tetsuya
	著者名 Yoshimura, Ryuji
	著者名 Ido, Toru
	NRID 1000080324820 1000080324820 ORCID 0000-0003-3876-2679 0000-0003-3876-2679 researchmap permalink read0068628 read0068628 Scopus Author ID 7402741552 7402741552 著者名 Matsuoka, Toshimasa
	NRID 1000020192180 1000020192180 著者名 Taniguchi, Kenji
キーワード等	CMOS
	subthreshold current
	ultra-low-power
	temperature dependence
抄録	We propose an ultra low power watch-dog circuit with the use of MOSFETs operation under subthreshold characteristics. The circuit monitors the amount of the product degradation because the subthreshold current of MOSFET emulates the rate of the general chemical reaction. Its operation was verified with both SPICE simulation and the measurement of the prototype chip. The new circuit embedded in a tag attached to any product could dynamically monitor the degradation regardless of storage conditions.
出版者	電子情報通信学会
	The Institute of Electronics, Information and Communication Engineers
	デンシ　ジョウホウ　ツウシン　ガッカイ
収録物名	IEICE Transactions on Electronics
巻(号)	E87-C(11)
ページ	1910-1914
刊行年月	2004-11
言語	英語
ハンドルURL	https://hdl.handle.net/11094/51705
PISSN	09168516
NCID	AA10826261
関連情報 (references)	URI https://search.ieice.org/
アクセス権	open access
権利情報	copyright©2004 IEICE
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	IEICE Transactions on Electronics. 2004, E87-C(11), p. 1910-1914
DC.title	Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current
DC.creator	Hirose, Tetsuya
	Yoshimura, Ryuji
	Ido, Toru
	Matsuoka, Toshimasa
	Taniguchi, Kenji
DC.publisher	電子情報通信学会
	The Institute of Electronics, Information and Communication Engineers
	デンシ　ジョウホウ　ツウシン　ガッカイ
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2004-11
DC.relation' scheme='DCTERMS.URI	https://search.ieice.org/
DC.subject	CMOS
	subthreshold current
	ultra-low-power
	temperature dependence
DCTERMS.abstract	We propose an ultra low power watch-dog circuit with the use of MOSFETs operation under subthreshold characteristics. The circuit monitors the amount of the product degradation because the subthreshold current of MOSFET emulates the rate of the general chemical reaction. Its operation was verified with both SPICE simulation and the measurement of the prototype chip. The new circuit embedded in a tag attached to any product could dynamically monitor the degradation regardless of storage conditions.
DC.rights	copyright©2004 IEICE
DC.format	51705
citation_title	Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current
citation_author	Hirose, Tetsuya
	Yoshimura, Ryuji
	Ido, Toru
	Matsuoka, Toshimasa
	Taniguchi, Kenji
citation_publisher	電子情報通信学会
citation_language	英語
citation_date	2004-11
citation_journal_title	IEICE Transactions on Electronics
citation_volume	E87-C
citation_issue	11
citation_firstpage	1910
citation_lastpage	1914
citation_public_url	https://hdl.handle.net/11094/51705
citation_abstract_html_url	https://search.ieice.org/

Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current

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