Detection of nonmagnetic metal thin film using magnetic force microscopy

Wakaya, Fujio; Oosawa, Kenta; Kajiwara, Masahiro; Abo, Satoshi; Takai, Mikio

doi:https://doi.org/10.1063/1.5079763

Detection of nonmagnetic metal thin film using magnetic force microscopy

Wakaya, Fujio; Oosawa, Kenta; Kajiwara, Masahiro et al.

Applied Physics Letters, 2018, 113(26), 261601

アクセス数:812件（2025-07-19 14:22 集計）

固定URL: https://hdl.handle.net/11094/71061

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タイトル	Detection of nonmagnetic metal thin film using magnetic force microscopy
著者	NRID 1000060240454 1000060240454 researchmap permalink read0105569 read0105569 Scopus Author ID 56237993800 56237993800 ORCID 0009-0004-5911-3648 0009-0004-5911-3648 著者名 Wakaya, Fujio
	著者名 Oosawa, Kenta
	著者名 Kajiwara, Masahiro
	NRID 1000060379310 1000060379310 researchmap permalink satoshi_abo satoshi_abo Scopus Author ID 8683193200 8683193200 ORCID 0009-0006-4937-8305 0009-0006-4937-8305 著者名 Abo, Satoshi
	NRID 1000090142306 1000090142306 著者名 Takai, Mikio
内容	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Fujio Wakaya; Kenta Oosawa; Masahiro Kajiwara; Satoshi Abo; Mikio Takai. Detection of nonmagnetic metal thin film using magnetic force microscopy. Applied Physics Letters. 2018, vol. 113, no. 26. and may be found at https://doi.org/10.1063/1.5079763.
抄録	Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a "metal detector" at the nanometer scale and for contactless measurement of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing determination of the best frequency for phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed.
出版者	AIP Publishing
収録物名	Applied Physics Letters
巻(号)	113(26)
ページ	261601
刊行年月	2018-12-24
言語	英語
ハンドルURL	https://hdl.handle.net/11094/71061
PISSN	00036951
eISSN	10773118
NCID	AA00543431
関連情報 (isVersionOf)	DOI (出版社版) https://doi.org/10.1063/1.5079763
アクセス権	open access
出版タイプ	Accepted Manuscript
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Applied Physics Letters. 2018, 113(26), p. 261601
DC.title	Detection of nonmagnetic metal thin film using magnetic force microscopy
DC.creator	Wakaya, Fujio
	Oosawa, Kenta
	Kajiwara, Masahiro
	Abo, Satoshi
	Takai, Mikio
DC.publisher	AIP Publishing
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2018-12-24
DC.identifier	https://doi.org/10.1063/1.5079763
DC.description	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Fujio Wakaya; Kenta Oosawa; Masahiro Kajiwara; Satoshi Abo; Mikio Takai. Detection of nonmagnetic metal thin film using magnetic force microscopy. Applied Physics Letters. 2018, vol. 113, no. 26. and may be found at https://doi.org/10.1063/1.5079763.
DCTERMS.abstract	Magnetic force microscopy (MFM) allows detection of stray magnetic fields around magnetic materials and the two-dimensional visualization of these fields. This paper presents a theoretical analysis of the oscillations of an MFM tip above a thin film of nonmagnetic metal. The results show good agreement with experimental data obtained by varying the tip height. The phenomenon analyzed here can be applied as a "metal detector" at the nanometer scale and for contactless measurement of sheet resistivity. The detection sensitivity is obtained as a function of oscillation frequency, thus allowing determination of the best frequency for phase-shift measurement. The shift in resonance frequency due to the presence of a nonmagnetic metal is also discussed.
DC.format	71061
citation_title	Detection of nonmagnetic metal thin film using magnetic force microscopy
citation_author	Wakaya, Fujio
	Oosawa, Kenta
	Kajiwara, Masahiro
	Abo, Satoshi
	Takai, Mikio
citation_publisher	AIP Publishing
citation_language	英語
citation_date	2018-12-24
citation_journal_title	Applied Physics Letters
citation_volume	113
citation_issue	26
citation_firstpage	261601
citation_doi	https://doi.org/10.1063/1.5079763
citation_public_url	https://hdl.handle.net/11094/71061

Detection of nonmagnetic metal thin film using magnetic force microscopy

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