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学術雑誌論文

学術雑誌論文

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Applied Physics Letters.69(6) P.734-P.736

Crystal structure analysis in solution-processed uniaxially oriented polycrystalline thin film of non-peripheral octahexyl phthalocyanine by grazing incidence wide-angle x-ray scattering techniques

AIP Publishing

英語

2016-10-12

info:doi/10.1063/1.4964741

http://hdl.handle.net/11094/75665

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Masashi Ohmori, Takashi Uno, Mitsuhiro Nakatani, Chika Nakano, Akihiko Fujiia, and Masanori Ozaki, Appl. Phys. Lett. 109, 153302 (2016) and may be found at https://doi.org/10.1063/1.4964741.

Uniaxially oriented thin films of metal-free non-peripherally octahexyl-substituted phthalocyanine (C6PcH2), which exhibits high carrier mobility, have been fabricated by the bar-coating technique, which is a simple solution process. The molecular orientation and molecular steps in the thin film were observed by the polarized spectroscopy and the atomic force microscopy, respectively. The three-dimensional molecular packing structure in the thin film was investigated by the grazing incidence wide-angle X-ray scattering technique with an in-plane sample rotation. The crystal orientation was clarified, and the three-dimensional molecular packing structure of the thin film was found to match the single crystal structure. Moreover, the X-ray diffraction patterns of the oriented thin films were simulated by using the lattice parameters of C6PcH2 single crystal to reproduce the observed X-ray diffraction patterns.The X-ray diffraction measurement in the BL46XU beamline at SPring-8 was carried out by the cooperation of the Dr. Itaru Osaka in Institute of Physical and Chemical Research (RIKEN). We thank Dr. Tomoyuki Koganezawa in the Japan Synchrotron Radiation Research Institute (JASRI) for helpful suggestions about the analysis of the XRD patterns. We appreciate Professor Koichi Sudoh of the Institute of Scientific and Industrial Research in Osaka University for helping with atomic-force microscopy. This work was partially supported by the Advanced Low Carbon Technology Research and Development Program from the Japan Science and Technology Agency and the JSPS KAKENHI Grant Nos. 15H03552, 24246009, 26600073 and a Grant-in-Aid for JSPS Fellows (No. 15J00448) from the Japan Society for the Promotion of Science and the Photonics Advanced Research Center at Osaka University.

Crystal structure analysis in solution-processed uniaxially oriented polycrystalline thin film of non-peripheral octahexyl phthalocyanine by grazing incidence wide-angle x-ray scattering techniques

AIP Publishing

英語

2016-10-12

Applied Physics Letters

109

15

153302

153302

info:doi/10.1063/1.4964741

http://hdl.handle.net/11094/75665