Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning

Ibuchi, Takaaki; Funaki, Tsuyoshi

Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020, 2020

アクセス数:450件（2025-08-28 14:07 集計）

固定URL: https://hdl.handle.net/11094/78285

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論文情報

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タイトル
Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning
著者
NRID
1000090755646 1000090755646
researchmap permalink
bucci bucci
Scopus Author ID
51461605600 51461605600
著者名
Ibuchi, Takaaki
NRID
1000020263220 1000020263220
ORCID
0000-0001-8776-5118 0000-0001-8776-5118
researchmap permalink
FunakiTsuyoshi FunakiTsuyoshi
Scopus Author ID
7005435048 7005435048
著者名
Funaki, Tsuyoshi
キーワード等
dynamic noise current behavior
near magnetic field intensity
Si IGBT
SiC MOSFET
visualization technology
内容
T. Ibuchi and T. Funaki, "Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning," 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy, 2020, pp. 1-6, doi: 10.1109/EMCEUROPE48519.2020.9245654.
抄録
This report studies the visualization of dynamic noise current distribution in switching operation of Si and SiC power devices. The measurement system is developed to identify time-dependent near magnetic field distribution for periodic steady state circuit operation. The experimental results shown in this report demonstrate the usefulness of the developed system to identify the EMI noise generation and to visualize the time variation of noise current distribution in the power conversion circuit.
出版者
Institute of Electrical and Electronics Engineers Inc.
収録物名
Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
刊行年月
2020-09-23
言語
英語
ハンドルURL
https://hdl.handle.net/11094/78285
関連情報 (isVersionOf)
DOI (出版社版)
https://doi.org/10.1109/EMCEUROPE48519.2020.9245654
アクセス権
open access
権利情報
© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
出版タイプ
Accepted Manuscript
カテゴリ
会議発表論文 Conference Paper