Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

Ogi, H.; Fujii, M.; Nakamura, N.; Shagawa, T.; Hirao, M.

doi:https://doi.org/10.1063/1.2737819

Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

Ogi, H.; Fujii, M.; Nakamura, N. et al.

Applied Physics Letters, 2007, 90(19), 191906-1-191906-3

アクセス数:645件（2025-07-31 07:44 集計）

固定URL: https://hdl.handle.net/11094/84208

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タイトル	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
著者	NRID 1000090252626 1000090252626 researchmap permalink read0042771 read0042771 Scopus Author ID 35563683500 35563683500 著者名 Ogi, H.
	著者名 Fujii, M.
	NRID 1000050452404 1000050452404 researchmap permalink nnakamura nnakamura Scopus Author ID 7403356186 7403356186 ORCID 0000-0002-5338-842X 0000-0002-5338-842X 著者名 Nakamura, N.
	著者名 Shagawa, T.
	NRID 1000080112027 1000080112027 著者名 Hirao, M.
内容	Ogi H., Fujii M., Nakamura N., et al. "Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films", Applied Physics Letters, 90(19), 191906 (2007) https://doi.org/10.1063/1.2737819.
抄録	Ultrahigh-frequency phonon resonances were excited in ultrathin films (∼5 nm) by femtosecond light pulses, and their resonance frequencies were measured to determine the through-thickness elastic constants. The studied materials were Pt and Fe. The elastic stiffness increases with decreasing film thickness for both materials, whereas the normal strain showed opposite thickness behavior. Analysis of the wave propagation using the third-order elastic constants explained these trends. © 2007 American Institute of Physics.
出版者	American Institute of Physics
収録物名	Applied Physics Letters
巻(号)	90(19)
ページ	191906-1-191906-3
刊行年月	2007-05-07
言語	英語
ハンドルURL	https://hdl.handle.net/11094/84208
PISSN	00036951
eISSN	10773118
NCID	AA00543431
NCID	AA11868096
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1063/1.2737819
アクセス権	open access
権利情報	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 90(19), 191906 (2007) and may be found at https://doi.org/10.1063/1.2737819.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Applied Physics Letters. 2007, 90(19), p. 191906-1-191906-3
DC.title	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
DC.creator	Ogi, H.
	Fujii, M.
	Nakamura, N.
	Shagawa, T.
	Hirao, M.
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2007-05-07
DC.identifier	https://doi.org/10.1063/1.2737819
DC.description	Ogi H., Fujii M., Nakamura N., et al. "Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films", Applied Physics Letters, 90(19), 191906 (2007) https://doi.org/10.1063/1.2737819.
DCTERMS.abstract	Ultrahigh-frequency phonon resonances were excited in ultrathin films (∼5 nm) by femtosecond light pulses, and their resonance frequencies were measured to determine the through-thickness elastic constants. The studied materials were Pt and Fe. The elastic stiffness increases with decreasing film thickness for both materials, whereas the normal strain showed opposite thickness behavior. Analysis of the wave propagation using the third-order elastic constants explained these trends. © 2007 American Institute of Physics.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 90(19), 191906 (2007) and may be found at https://doi.org/10.1063/1.2737819.
DC.format	84208
citation_title	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
citation_author	Ogi, H.
	Fujii, M.
	Nakamura, N.
	Shagawa, T.
	Hirao, M.
citation_publisher	American Institute of Physics
citation_language	英語
citation_date	2007-05-07
citation_journal_title	Applied Physics Letters
citation_volume	90
citation_issue	19
citation_firstpage	191906-1
citation_lastpage	191906-3
citation_doi	https://doi.org/10.1063/1.2737819
citation_public_url	https://hdl.handle.net/11094/84208

Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

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