Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

Inubushi, Yuichi; Inoue, Ichiro; Kim, Jangwoo; Nishihara, Akihiko; Matsuyama, Satoshi; Yumoto, Hirokatsu; Koyama, Takahisa; Tono, Kensuke; Ohashi, Haruhiko; Yamauchi, Kazuto; Yabashi, Makina

doi:https://doi.org/10.3390/app7060584

Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

Inubushi, Yuichi; Inoue, Ichiro; Kim, Jangwoo et al.

Applied Sciences, 2017, 7(6), 584

アクセス数:1,207件（2025-07-14 20:37 集計）

固定URL: https://hdl.handle.net/11094/86956

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タイトル	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
著者	NRID 1000040506250 1000040506250 著者名 Inubushi, Yuichi
	NRID 1000030783401 1000030783401 著者名 Inoue, Ichiro
	著者名 Kim, Jangwoo
	著者名 Nishihara, Akihiko
	NRID 1000010423196 1000010423196 著者名 Matsuyama, Satoshi
	NRID 1000020423197 1000020423197 著者名 Yumoto, Hirokatsu
	NRID 1000020468276 1000020468276 著者名 Koyama, Takahisa
	NRID 1000000353508 1000000353508 著者名 Tono, Kensuke
	NRID 1000030443550 1000030443550 著者名 Ohashi, Haruhiko
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 著者名 Yamauchi, Kazuto
	NRID 1000000372144 1000000372144 著者名 Yabashi, Makina
キーワード等	XFEL
	spectroscopy
	ultra-shot pulse
内容	Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584. https://doi.org/10.3390/app7060584.
抄録	We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
出版者	MDPI
収録物名	Applied Sciences
巻(号)	7(6)
ページ	584
刊行年月	2017-06-06
言語	英語
ハンドルURL	https://hdl.handle.net/11094/86956
eISSN	20763417
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.3390/app7060584
アクセス権	open access
権利情報	This article is licensed under a Creative Commons Attribution 4.0 International License.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Applied Sciences. 2017, 7(6), p. 584
DC.title	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
DC.creator	Inubushi, Yuichi
	Inoue, Ichiro
	Kim, Jangwoo
	Nishihara, Akihiko
	Matsuyama, Satoshi
	Yumoto, Hirokatsu
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yamauchi, Kazuto
	Yabashi, Makina
DC.publisher	MDPI
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2017-06-06
DC.identifier	https://doi.org/10.3390/app7060584
DC.subject	XFEL
	spectroscopy
	ultra-shot pulse
DC.description	Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584. https://doi.org/10.3390/app7060584.
DCTERMS.abstract	We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
DC.rights	This article is licensed under a Creative Commons Attribution 4.0 International License.
DC.format	86956
citation_title	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
citation_author	Inubushi, Yuichi
	Inoue, Ichiro
	Kim, Jangwoo
	Nishihara, Akihiko
	Matsuyama, Satoshi
	Yumoto, Hirokatsu
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yamauchi, Kazuto
	Yabashi, Makina
citation_publisher	MDPI
citation_language	英語
citation_date	2017-06-06
citation_journal_title	Applied Sciences
citation_volume	7
citation_issue	6
citation_firstpage	584
citation_doi	https://doi.org/10.3390/app7060584
citation_public_url	https://hdl.handle.net/11094/86956

Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

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