学術雑誌論文

学術雑誌論文

text

Applied Physics Letters. 2011, 99(13), p. 131905

Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering

American Institute of Physics

英語

text

2011-09-26

https://doi.org/10.1063/1.3644396

Yukio Takahashi, Akihiro Suzuki, Nobuyuki Zettsu, Yoshiki Kohmura, Kazuto Yamauchi, and Tetsuya Ishikawa, "Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering", Appl. Phys. Lett. 99(13), 131905 (2011) https://doi.org/10.1063/1.3644396.

We propose an element mapping technique of nano-meso-microscale structures buried within large and/or thick objects by ptychographic x-ray diffraction microscopy using anomalous scattering. We performed quantitative imagings of both the electron density and Au element of Au/Ag nanoparticles at the pixel resolution of better than 10 nm in a field of view larger than 5 × 5 μm2 by directly phasing ptychographic coherent diffraction patterns acquired at two x-ray energies below the Au L3 edge. This method provides us with multiscale structural and elemental information for understanding the element/property relationship linking nanoscale structures to macroscopic functional properties in material and biological systems. © 2011 American Institute of Physics.

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Appl. Phys. Lett. 99(13), 131905 (2011) and may be found at https://doi.org/10.1063/1.3644396.

86974

Multiscale element mapping of buried structures by ptychographic x-ray diffraction microscopy using anomalous scattering

American Institute of Physics

英語

2011-09-26

Applied Physics Letters

99

13

131905

https://doi.org/10.1063/1.3644396

https://hdl.handle.net/11094/86974