学術雑誌論文

学術雑誌論文

text

Physical Review B - Condensed Matter and Materials Physics. 2011, 83(21), p. 214109

Towards high-resolution ptychographic x-ray diffraction microscopy

American Physical Society (APS)

英語

text

2011-06-13

https://doi.org/10.1103/PhysRevB.83.214109

Yukio Takahashi, Akihiro Suzuki, Nobuyuki Zettsu, Yoshiki Kohmura, Yasunori Senba, Haruhiko Ohashi, Kazuto Yamauchi, and Tetsuya Ishikawa. Phys. Rev. B 83(21), 214109 (2011).

Ptychographic x-ray diffraction microscopy is a lensless imaging technique with a large field of view and high spatial resolution, which is also useful for characterizing the wavefront of an x-ray probe. The performance of this technique is degraded by positioning errors due to the drift between the sample and illumination optics. We propose an experimental approach for correcting the positioning errors and demonstrate success by two-dimensionally reconstructing both the wavefront of the focused x-ray beam and the complex transmissivity of the weakly scattering objects at the pixel resolution of better than 10 nm in the field of view larger than 5 μm. This method is applicable to not only the observation of organelles inside cells or nano-mesoscale structures buried within bulk materials but also the characterization of probe for single-shot imaging with x-ray free electron lasers. © 2011 American Physical Society.

Copyright 2011 by the American Physical Society

86984

Towards high-resolution ptychographic x-ray diffraction microscopy

American Physical Society (APS)

英語

2011-06-13

Physical Review B - Condensed Matter and Materials Physics

83

21

214109

https://doi.org/10.1103/PhysRevB.83.214109

https://hdl.handle.net/11094/86984