Single-Shot Spectrometry for X-Ray Free-Electron Lasers

Yabashi, Makina; Hastings, Jerome B.; Zolotorev, Max S.; Mimura, Hidekazu; Yumoto, Hirokatsu; Matsuyama, Satoshi; Yamauchi, Kazuto; Ishikawa, Tetsuya

doi:https://doi.org/10.1103/PhysRevLett.97.084802

Single-Shot Spectrometry for X-Ray Free-Electron Lasers

Yabashi, Makina; Hastings, Jerome B.; Zolotorev, Max S. et al.

Physical Review Letters, 2006, 97(8), 084802

アクセス数:685件（2025-07-10 07:40 集計）

固定URL: https://hdl.handle.net/11094/86985

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タイトル	Single-Shot Spectrometry for X-Ray Free-Electron Lasers
著者	NRID 1000000372144 1000000372144 著者名 Yabashi, Makina
	著者名 Hastings, Jerome B.
	著者名 Zolotorev, Max S.
	NRID 1000030362651 1000030362651 著者名 Mimura, Hidekazu
	NRID 1000020423197 1000020423197 著者名 Yumoto, Hirokatsu
	NRID 1000010423196 1000010423196 著者名 Matsuyama, Satoshi
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 著者名 Yamauchi, Kazuto
	NRID 1000080159699 1000080159699 著者名 Ishikawa, Tetsuya
内容	Makina Yabashi, Jerome B. Hastings, Max S. Zolotorev, Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Kazuto Yamauchi, and Tetsuya Ishikawa. Phys. Rev. Lett. 97(8), 084802 (2006).
抄録	An experimental scheme to realize single-shot spectrometry for the diagnostics of x-ray free-electron lasers (XFELs) is presented. The combination of an ultraprecisely figured mirror and a perfect crystal form a simple, high-precision spectrometer that can cover an energy range from a few eV to a hundred eV with high resolution. The application of the spectrometer to determine XFEL pulse widths was investigated theoretically and experimentally. It has been shown that the present system can determine pulse widths from sub-fs to ps in a single shot even for spontaneous radiation. The system can be easily extended to even shorter pulses.
出版者	American Physical Society (APS)
収録物名	Physical Review Letters
巻(号)	97(8)
ページ	084802
刊行年月	2006-08-25
言語	英語
ハンドルURL	https://hdl.handle.net/11094/86985
PISSN	00319007
eISSN	10797114
NCID	AA00773679
NCID	AA11734748
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1103/PhysRevLett.97.084802
アクセス権	open access
権利情報	Copyright 2006 by the American Physical Society
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Physical Review Letters. 2006, 97(8), p. 084802
DC.title	Single-Shot Spectrometry for X-Ray Free-Electron Lasers
DC.creator	Yabashi, Makina
	Hastings, Jerome B.
	Zolotorev, Max S.
	Mimura, Hidekazu
	Yumoto, Hirokatsu
	Matsuyama, Satoshi
	Yamauchi, Kazuto
	Ishikawa, Tetsuya
DC.publisher	American Physical Society (APS)
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2006-08-25
DC.identifier	https://doi.org/10.1103/PhysRevLett.97.084802
DC.description	Makina Yabashi, Jerome B. Hastings, Max S. Zolotorev, Hidekazu Mimura, Hirokatsu Yumoto, Satoshi Matsuyama, Kazuto Yamauchi, and Tetsuya Ishikawa. Phys. Rev. Lett. 97(8), 084802 (2006).
DCTERMS.abstract	An experimental scheme to realize single-shot spectrometry for the diagnostics of x-ray free-electron lasers (XFELs) is presented. The combination of an ultraprecisely figured mirror and a perfect crystal form a simple, high-precision spectrometer that can cover an energy range from a few eV to a hundred eV with high resolution. The application of the spectrometer to determine XFEL pulse widths was investigated theoretically and experimentally. It has been shown that the present system can determine pulse widths from sub-fs to ps in a single shot even for spontaneous radiation. The system can be easily extended to even shorter pulses.
DC.rights	Copyright 2006 by the American Physical Society
DC.format	86985
citation_title	Single-Shot Spectrometry for X-Ray Free-Electron Lasers
citation_author	Yabashi, Makina
	Hastings, Jerome B.
	Zolotorev, Max S.
	Mimura, Hidekazu
	Yumoto, Hirokatsu
	Matsuyama, Satoshi
	Yamauchi, Kazuto
	Ishikawa, Tetsuya
citation_publisher	American Physical Society (APS)
citation_language	英語
citation_date	2006-08-25
citation_journal_title	Physical Review Letters
citation_volume	97
citation_issue	8
citation_firstpage	084802
citation_doi	https://doi.org/10.1103/PhysRevLett.97.084802
citation_public_url	https://hdl.handle.net/11094/86985

Single-Shot Spectrometry for X-Ray Free-Electron Lasers

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