Hard x-ray intensity autocorrelation using direct two-photon absorption

Osaka, Taito; Inoue, Ichiro; Yamada, Jumpei; Inubushi, Yuichi; Matsumura, Shotaro; Sano, Yasuhisa; Tono, Kensuke; Yamauchi, Kazuto; Tamasaku, Kenji; Yabashi, Makina

doi:https://doi.org/10.1103/PhysRevResearch.4.L012035

Hard x-ray intensity autocorrelation using direct two-photon absorption

Osaka, Taito; Inoue, Ichiro; Yamada, Jumpei et al.

Physical Review Research, 2022, 4(1), L012035

アクセス数:237件（2025-05-14 01:52 集計）

固定URL: https://hdl.handle.net/11094/89661

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タイトル	Hard x-ray intensity autocorrelation using direct two-photon absorption
著者	NRID 1000070782887 1000070782887 著者名 Osaka, Taito
	NRID 1000030783401 1000030783401 著者名 Inoue, Ichiro
	NRID 1000010845027 1000010845027 researchmap permalink J_Y190325 J_Y190325 著者名 Yamada, Jumpei
	NRID 1000040506250 1000040506250 著者名 Inubushi, Yuichi
	著者名 Matsumura, Shotaro
	NRID 1000040252598 1000040252598 ORCID 0000-0002-1767-922X 0000-0002-1767-922X researchmap permalink read0042804 read0042804 Scopus Author ID 7402344818 7402344818 著者名 Sano, Yasuhisa
	NRID 1000000353508 1000000353508 著者名 Tono, Kensuke
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 著者名 Yamauchi, Kazuto
	NRID 1000030300883 1000030300883 著者名 Tamasaku, Kenji
	NRID 1000000372144 1000000372144 著者名 Yabashi, Makina
内容	Osaka T., Inoue I., Yamada J., et al. Hard x-ray intensity autocorrelation using direct two-photon absorption. Physical Review Research, 4, 1, L012035. https://doi.org/10.1103/PhysRevResearch.4.L012035.
抄録	An intensity autocorrelation measurement is demonstrated to characterize a pulse duration of 9-keV x-ray free-electron laser (XFEL) pulses from a split-delay optical (SDO) system with four-bounce silicon 220 reflections in each branch. XFEL pulse replicas with variable time delays are generated by the SDO system itself. High intensity of >2×1016W/cm2 achieved in a self-seeding operation and careful data analysis allow the measurement with direct two-photon absorption. The autocorrelation trace gave a duration of 7.6±0.8fs in full width at half maximum for a Gaussian assumption. Furthermore, the trace shows good agreement with a simulation of the XFEL pulse shape propagating through the SDO system, irrespective of spectral chirps in the original XFEL pulses. Our results open the door toward direct temporal characterization of narrowband XFELs at the hard x-ray regime, such as self-seeded and future cavity-based XFELs, and indicate a solid way for temporal tailoring of ultrafast x-ray pulses with perfect crystals.
出版者	American Physical Society
収録物名	Physical Review Research
巻(号)	4(1)
ページ	L012035
刊行年月	2022-03-18
言語	英語
ハンドルURL	https://hdl.handle.net/11094/89661
PISSN	26431564
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1103/PhysRevResearch.4.L012035
アクセス権	open access
権利情報	This article is licensed under a Creative Commons Attribution 4.0 International License.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Physical Review Research. 2022, 4(1), p. L012035
DC.title	Hard x-ray intensity autocorrelation using direct two-photon absorption
DC.creator	Osaka, Taito
	Inoue, Ichiro
	Yamada, Jumpei
	Inubushi, Yuichi
	Matsumura, Shotaro
	Sano, Yasuhisa
	Tono, Kensuke
	Yamauchi, Kazuto
	Tamasaku, Kenji
	Yabashi, Makina
DC.publisher	American Physical Society
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2022-03-18
DC.identifier	https://doi.org/10.1103/PhysRevResearch.4.L012035
DC.description	Osaka T., Inoue I., Yamada J., et al. Hard x-ray intensity autocorrelation using direct two-photon absorption. Physical Review Research, 4, 1, L012035. https://doi.org/10.1103/PhysRevResearch.4.L012035.
DCTERMS.abstract	An intensity autocorrelation measurement is demonstrated to characterize a pulse duration of 9-keV x-ray free-electron laser (XFEL) pulses from a split-delay optical (SDO) system with four-bounce silicon 220 reflections in each branch. XFEL pulse replicas with variable time delays are generated by the SDO system itself. High intensity of >2×1016W/cm2 achieved in a self-seeding operation and careful data analysis allow the measurement with direct two-photon absorption. The autocorrelation trace gave a duration of 7.6±0.8fs in full width at half maximum for a Gaussian assumption. Furthermore, the trace shows good agreement with a simulation of the XFEL pulse shape propagating through the SDO system, irrespective of spectral chirps in the original XFEL pulses. Our results open the door toward direct temporal characterization of narrowband XFELs at the hard x-ray regime, such as self-seeded and future cavity-based XFELs, and indicate a solid way for temporal tailoring of ultrafast x-ray pulses with perfect crystals.
DC.rights	This article is licensed under a Creative Commons Attribution 4.0 International License.
DC.format	89661
citation_title	Hard x-ray intensity autocorrelation using direct two-photon absorption
citation_author	Osaka, Taito
	Inoue, Ichiro
	Yamada, Jumpei
	Inubushi, Yuichi
	Matsumura, Shotaro
	Sano, Yasuhisa
	Tono, Kensuke
	Yamauchi, Kazuto
	Tamasaku, Kenji
	Yabashi, Makina
citation_publisher	American Physical Society
citation_language	英語
citation_date	2022-03-18
citation_journal_title	Physical Review Research
citation_volume	4
citation_issue	1
citation_firstpage	L012035
citation_doi	https://doi.org/10.1103/PhysRevResearch.4.L012035
citation_public_url	https://hdl.handle.net/11094/89661

Hard x-ray intensity autocorrelation using direct two-photon absorption

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