Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

Shiratsuchi, Yu; Nakano, Yuuta; Inami, Nobuhito; Ueno, Tetsuro; Ono, Kanta; Kumai, Reiji; Sagayama, Ryoko; Nakatani, Ryoichi

doi:https://doi.org/10.1063/1.5020620

Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

Shiratsuchi, Yu; Nakano, Yuuta; Inami, Nobuhito et al.

Journal of Applied Physics, 2018, 123(10), 103903

アクセス数:124件（2025-03-14 18:34 集計）

固定URL: https://hdl.handle.net/11094/89972

閲覧可能ファイル

ファイル	フォーマット	利用条件	サイズ	閲覧回数	利用開始日	説明	information
JApplPhys_123_10	pdf	なし	3.03 MB	109	2023.02.01

論文情報

ファイル出力 EndNote Basic出力 Mendeley出力

タイトル	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
著者	NRID 1000070379121 1000070379121 ORCID 0000-0002-8938-4869 0000-0002-8938-4869 researchmap permalink read0090304 read0090304 Scopus Author ID 6602197167 6602197167 著者名 Shiratsuchi, Yu
	著者名 Nakano, Yuuta
	著者名 Inami, Nobuhito
	NRID 1000020609747 1000020609747 著者名 Ueno, Tetsuro
	NRID 1000070282572 1000070282572 ORCID 0000-0002-3285-9093 0000-0002-3285-9093 researchmap permalink onokanta onokanta Scopus Author ID 7403890224 7403890224 著者名 Ono, Kanta
	NRID 1000000356924 1000000356924 著者名 Kumai, Reiji
	著者名 Sagayama, Ryoko
	NRID 1000060314374 1000060314374 researchmap permalink read0068619 read0068619 Scopus Author ID 7005234924 7005234924 著者名 Nakatani, Ryoichi
内容	Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018); https://doi.org/10.1063/1.5020620.
抄録	The structures of antiferromagnetic Cr₂O₃(0001) thin films with perpendicular exchange bias were investigated using reflection high-energy electron diffraction, X-ray reflectivity, and synchrotron X-ray diffraction. We mainly investigated the specific ion positions of Cr³⁺ and O²- in the corundum structure and discussed their relationship to the magnetic anisotropy of Cr₂O₃. The Cr₂O₃(0001) thin film grown on a Pt(111) buffer layer exhibited a perpendicular exchange anisotropy density of 0.42 mJ/m², in which the Cr³⁺ position is the primary factor in the enhancement of magnetic anisotropy due to dipolar-interaction. In contrast, the single-crystalline Cr₂O₃(0001) film grown on a α-Al₂O₃(0001) substrate featured a low exchange magnetic anisotropy of 0.098 mJ/m². In this film, the Cr³⁺ position parameter is an insignificant factor, leading to low magnetic anisotropy. The O²- ion position also differs between the two types of films, which can affect both the magnetic anisotropy energy originating from fine structures and the magneto-electric properties of Cr₂O₃.
出版者	American Institute of Physics
収録物名	Journal of Applied Physics
巻(号)	123(10)
ページ	103903
刊行年月	2018-03-14
言語	英語
ハンドルURL	https://hdl.handle.net/11094/89972
PISSN	00218979
eISSN	10897550
NCID	AA00693547
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1063/1.5020620
アクセス権	open access
権利情報	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018) and may be found at https://doi.org/10.1063/1.5020620.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Journal of Applied Physics. 2018, 123(10), p. 103903
DC.title	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
DC.creator	Shiratsuchi, Yu
	Nakano, Yuuta
	Inami, Nobuhito
	Ueno, Tetsuro
	Ono, Kanta
	Kumai, Reiji
	Sagayama, Ryoko
	Nakatani, Ryoichi
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2018-03-14
DC.identifier	https://doi.org/10.1063/1.5020620
DC.description	Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018); https://doi.org/10.1063/1.5020620.
DCTERMS.abstract	The structures of antiferromagnetic Cr₂O₃(0001) thin films with perpendicular exchange bias were investigated using reflection high-energy electron diffraction, X-ray reflectivity, and synchrotron X-ray diffraction. We mainly investigated the specific ion positions of Cr³⁺ and O²- in the corundum structure and discussed their relationship to the magnetic anisotropy of Cr₂O₃. The Cr₂O₃(0001) thin film grown on a Pt(111) buffer layer exhibited a perpendicular exchange anisotropy density of 0.42 mJ/m², in which the Cr³⁺ position is the primary factor in the enhancement of magnetic anisotropy due to dipolar-interaction. In contrast, the single-crystalline Cr₂O₃(0001) film grown on a α-Al₂O₃(0001) substrate featured a low exchange magnetic anisotropy of 0.098 mJ/m². In this film, the Cr³⁺ position parameter is an insignificant factor, leading to low magnetic anisotropy. The O²- ion position also differs between the two types of films, which can affect both the magnetic anisotropy energy originating from fine structures and the magneto-electric properties of Cr₂O₃.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018) and may be found at https://doi.org/10.1063/1.5020620.
DC.format	89972
citation_title	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
citation_author	Shiratsuchi, Yu
	Nakano, Yuuta
	Inami, Nobuhito
	Ueno, Tetsuro
	Ono, Kanta
	Kumai, Reiji
	Sagayama, Ryoko
	Nakatani, Ryoichi
citation_publisher	American Institute of Physics
citation_language	英語
citation_date	2018-03-14
citation_journal_title	Journal of Applied Physics
citation_volume	123
citation_issue	10
citation_firstpage	103903
citation_doi	https://doi.org/10.1063/1.5020620
citation_public_url	https://hdl.handle.net/11094/89972

Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

閲覧可能ファイル

論文情報

論文詳細を表示