Hybrid mode atomic force microscopy of phase modulation and frequency modulation

Yamamoto, Tatsuya; Miyazaki, Masato; Nomura, Hikaru; Li, Yan Jun; Sugawara, Yasuhiro

doi:https://doi.org/10.1093/jmicro/dfac057

Hybrid mode atomic force microscopy of phase modulation and frequency modulation

Yamamoto, Tatsuya; Miyazaki, Masato; Nomura, Hikaru et al.

Microscopy, 2023, 72(3), 236-242

アクセス数:641件（2025-08-28 17:22 集計）

固定URL: https://hdl.handle.net/11094/93978

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タイトル	Hybrid mode atomic force microscopy of phase modulation and frequency modulation
著者	著者名 Yamamoto, Tatsuya
	著者名 Miyazaki, Masato
	NRID 1000020506258 1000020506258 著者名 Nomura, Hikaru
	NRID 1000050379137 1000050379137 researchmap permalink liyanjun50379137 liyanjun50379137 Scopus Author ID 35558743600 35558743600 著者名 Li, Yan Jun
	NRID 1000040206404 1000040206404 researchmap permalink read0082006 read0082006 Scopus Author ID 7201773028 7201773028 著者名 Sugawara, Yasuhiro
キーワード等	atomic force microscopy
	frequency modulation
	hybrid mode
	phase modulation
内容	This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Yamamoto T., Miyazaki M., Nomura H., et al. Hybrid mode atomic force microscopy of phase modulation and frequency modulation. 72(3), 236-242 1 June 2023 is available online at: https://doi.org/10.1093/jmicro/dfac057.
抄録	We propose hybrid phase modulation (PM)/frequency modulation (FM) atomic force microscopy (AFM) to increase the imaging speed of AFM in high-Q environments. We derive the relationship between the phase shift, the frequency shift and the tip-sample interaction force from the equation of motion for the cantilever in high-Q environments. The tip-sample conservative force is approximately given by the sum of the conservative force with respect to the phase shift in the PM mode and that with respect to the frequency shift in the FM mode. We preliminarily demonstrate that the hybrid PM/FM-AFM is a new and very promising AFM operation mode that can increase imaging speed.
出版者	Oxford University Press
収録物名	Microscopy
巻(号)	72(3)
ページ	236-242
刊行年月	2023-06-01
言語	英語
ハンドルURL	https://hdl.handle.net/11094/93978
PISSN	20505698
eISSN	20505701
関連情報 (isVersionOf)	DOI (出版社版) https://doi.org/10.1093/jmicro/dfac057
アクセス権	open access
権利情報	© 2022 The Author(s). Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
出版タイプ	Accepted Manuscript
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCMI資源タイプ	text
DCTERMS.bibliographicCitation	Microscopy. 2023, 72(3), p. 236-242
DC.title	Hybrid mode atomic force microscopy of phase modulation and frequency modulation
DC.creator	Yamamoto, Tatsuya
	Miyazaki, Masato
	Nomura, Hikaru
	Li, Yan Jun
	Sugawara, Yasuhiro
DC.publisher	Oxford University Press
DC.language' scheme='DCTERMS.RFC1766	英語
DC.type' scheme='DCTERMS.DCMIType	text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2023-06-01
DC.identifier	https://doi.org/10.1093/jmicro/dfac057
DC.subject	atomic force microscopy
	frequency modulation
	hybrid mode
	phase modulation
DC.description	This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Yamamoto T., Miyazaki M., Nomura H., et al. Hybrid mode atomic force microscopy of phase modulation and frequency modulation. 72(3), 236-242 1 June 2023 is available online at: https://doi.org/10.1093/jmicro/dfac057.
DCTERMS.abstract	We propose hybrid phase modulation (PM)/frequency modulation (FM) atomic force microscopy (AFM) to increase the imaging speed of AFM in high-Q environments. We derive the relationship between the phase shift, the frequency shift and the tip-sample interaction force from the equation of motion for the cantilever in high-Q environments. The tip-sample conservative force is approximately given by the sum of the conservative force with respect to the phase shift in the PM mode and that with respect to the frequency shift in the FM mode. We preliminarily demonstrate that the hybrid PM/FM-AFM is a new and very promising AFM operation mode that can increase imaging speed.
DC.rights	© 2022 The Author(s). Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
DC.format	93978
citation_title	Hybrid mode atomic force microscopy of phase modulation and frequency modulation
citation_author	Yamamoto, Tatsuya
	Miyazaki, Masato
	Nomura, Hikaru
	Li, Yan Jun
	Sugawara, Yasuhiro
citation_publisher	Oxford University Press
citation_language	英語
citation_date	2023-06-01
citation_journal_title	Microscopy
citation_volume	72
citation_issue	3
citation_firstpage	236
citation_lastpage	242
citation_doi	https://doi.org/10.1093/jmicro/dfac057
citation_public_url	https://hdl.handle.net/11094/93978

Hybrid mode atomic force microscopy of phase modulation and frequency modulation

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