Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering

Sato, Kazuhisa

doi:https://doi.org/10.1021/acsomega.2c05634

Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering

Sato, Kazuhisa

ACS Omega, 2022, 7(44), 40480-40484

アクセス数:266件（2025-07-11 23:47 集計）

固定URL: https://hdl.handle.net/11094/97370

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タイトル	Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering
著者	NRID 1000070314424 1000070314424 ORCID 0000-0001-9078-2541 0000-0001-9078-2541 researchmap permalink read0158304 read0158304 Scopus Author ID 55552977400 55552977400 著者名 Sato, Kazuhisa
内容	Sato K., . Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering. ACS Omega 7, 40480 (2022); https://doi.org/10.1021/acsomega.2c05634.
抄録	Thin films of V-doped Sb₂Te₃compounds were fabricated by co-deposition of Sb₂Te₃and V using rf-magnetron sputtering onto SrTiO₃(001) substrates kept at 570 K. The microstructures of the films were characterized using transmission electron microscopy (TEM) and electron diffraction. The crystal structure of the sputtered film (Sb₃₈V₂Te₆₀) is the Bi₂Te₃-type structure with lattice parameters of a = 0.44 ± 0.03 nm and c = 3.02 ± 0.02 nm. A combination of cross-sectional and plan-view TEM observations revealed the preferential orientation of the c axis in the film's normal direction. A thin amorphous layer exists between the Sb₂Te₃thin film and the SrTiO₃substrate. The interfacial amorphous layer relaxes the strain between the thin film and the substrate, and hence, it should promote the growth of a low-index atomic plane with a low surface free energy (i.e., (0001) of the Sb₂Te₃). The onset of ferromagnetic order was detected at temperatures below 70 K. A remarkable increase in magnetization was detected in the film's normal direction, which corresponds to the magnetic easy axis (i.e., c axis of the Sb₂Te₃). V³⁺ions substituting Sb sites should contribute to ferromagnetism at low temperatures.
出版者	American Chemical Society
収録物名	ACS Omega
巻(号)	7(44)
ページ	40480-40484
刊行年月	2022-10-31
言語	英語
ハンドルURL	https://hdl.handle.net/11094/97370
eISSN	24701343
関連情報 (isIdenticalTo)	DOI (出版社版) https://doi.org/10.1021/acsomega.2c05634
アクセス権	open access
権利情報	This article is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
出版タイプ	Version of Record
カテゴリ	学術雑誌論文 Journal Article

資源タイプ	学術雑誌論文
ローカル資源タイプ	学術雑誌論文
DCTERMS.bibliographicCitation	ACS Omega. 2022, 7(44), p. 40480-40484
DC.title	Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering
DC.creator	Sato, Kazuhisa
DC.publisher	American Chemical Society
DC.language' scheme='DCTERMS.RFC1766	英語
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2022-10-31
DC.identifier	https://doi.org/10.1021/acsomega.2c05634
DC.description	Sato K., . Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering. ACS Omega 7, 40480 (2022); https://doi.org/10.1021/acsomega.2c05634.
DCTERMS.abstract	Thin films of V-doped Sb₂Te₃compounds were fabricated by co-deposition of Sb₂Te₃and V using rf-magnetron sputtering onto SrTiO₃(001) substrates kept at 570 K. The microstructures of the films were characterized using transmission electron microscopy (TEM) and electron diffraction. The crystal structure of the sputtered film (Sb₃₈V₂Te₆₀) is the Bi₂Te₃-type structure with lattice parameters of a = 0.44 ± 0.03 nm and c = 3.02 ± 0.02 nm. A combination of cross-sectional and plan-view TEM observations revealed the preferential orientation of the c axis in the film's normal direction. A thin amorphous layer exists between the Sb₂Te₃thin film and the SrTiO₃substrate. The interfacial amorphous layer relaxes the strain between the thin film and the substrate, and hence, it should promote the growth of a low-index atomic plane with a low surface free energy (i.e., (0001) of the Sb₂Te₃). The onset of ferromagnetic order was detected at temperatures below 70 K. A remarkable increase in magnetization was detected in the film's normal direction, which corresponds to the magnetic easy axis (i.e., c axis of the Sb₂Te₃). V³⁺ions substituting Sb sites should contribute to ferromagnetism at low temperatures.
DC.rights	This article is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
DC.format	97370
citation_title	Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering
citation_author	Sato, Kazuhisa
citation_publisher	American Chemical Society
citation_language	英語
citation_date	2022-10-31
citation_journal_title	ACS Omega
citation_volume	7
citation_issue	44
citation_firstpage	40480
citation_lastpage	40484
citation_doi	https://doi.org/10.1021/acsomega.2c05634
citation_public_url	https://hdl.handle.net/11094/97370

Structural Defects and Ferromagnetic Signature of V-Doped Sb₂Te₃Thin Films Grown on SrTiO₃(001) Produced by RF-Magnetron Sputtering

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