Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer

Xia, Mingqian; Hayashi, Takahiro; Mori, Naoki

NDT and E International, 2025, 151, 103316

Number of Access:301（2025-08-15 01:09 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/100389

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Title
Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer
Creator
CreatorName
Xia, Mingqian
NRID
1000030324479 1000030324479
ORCID
0000-0001-6064-4658 0000-0001-6064-4658
researchmap permalink
takahiro_hayashi takahiro_hayashi
Scopus Author ID
37064150200 37064150200
CreatorName
Hayashi, Takahiro
NRID
1000000802092 1000000802092
ORCID
0000-0002-0707-3443 0000-0002-0707-3443
researchmap permalink
7000020478 7000020478
Scopus Author ID
55614094500 55614094500
CreatorName
Mori, Naoki
Subject
Defect imaging
Lamb wave
Phased array
Ultrasonic
Waveguide
Description
Xia M., Hayashi T., Mori N. Experimental investigation of defect imaging using a phased array probe with a stacked plate buffer. NDT and E International 151, 103316 (2025); https://doi.org/10.1016/j.ndteint.2024.103316.
Abstract
The authors have previously validated defect imaging using stacked plate buffer and a phased array probe by numerical simulations. This study experimentally verifies the feasibility of this approach. A stacked plate buffer created by considering the dispersion of the S0 mode of Lamb waves was used for the first experiments, which showed that high intensity spurious areas appeared and defect images were blurred. Numerical analysis of the propagation of S0 modes in the plate revealed that trailing waves cause the high intensity spurious areas. Theoretical and numerical analyses indicated that the trailing waves can be removed by increasing the width of the plate. Finally, experiments using wider plates verified that a phased array probe with a stacked plate buffer can eliminate the high intensity spurious areas and clarify the defect images.
Publisher
Elsevier Ltd
Source Title
NDT and E International
Volume (Issue)
151
Page
103316
Date of Issued
2025-04-01
Language
English
Handle URL
https://hdl.handle.net/11094/100389
PISSN
09638695
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1016/j.ndteint.2024.103316
Access Rights
open access
CopyRight
This article is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
oaire:version
Version of Record
Category
学術雑誌論文 Journal Article