Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact

Jansen, R.; Spiesser, A.; Fujita, Y. et al.

Physical Review B, 2023, 107(2), 024411

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Identifier to cite or link to this item: https://hdl.handle.net/11094/101977

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Title
Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact
Creator
NRID
1000040600250 1000040600250
CreatorName
Jansen, R.
NRID
1000090793513 1000090793513
CreatorName
Spiesser, A.
CreatorName
Fujita, Y.
NRID
1000050357068 1000050357068
CreatorName
Saito, H.
NRID
1000090401281 1000090401281
ORCID
0000-0002-5473-6086 0000-0002-5473-6086
researchmap permalink
read0102192 read0102192
Scopus Author ID
9244846800 9244846800
CreatorName
Hamaya, K.
CreatorName
Yuasa, S.
Description
Jansen R., Spiesser A., Fujita Y., et al. Scaling with MgO thickness of the proximity exchange field in a Fe/MgO/Si contact. Physical Review B 107, 024411 (2023); https://doi.org/10.1103/physrevb.107.024411.
Abstract
The scaling of the proximity exchange field, which ferromagnetic Fe exerts on the spin accumulation at the MgO/Si interface of Fe/MgO/Si tunnel contacts, was investigated using the inverted Hanle effect. Data as a function of the applied bias voltage shows that the exchange field varies with bias in the same way as the square of the tunnel spin polarization (TSP). The decay of the exchange field with increasing MgO thickness tMgO is rather weak and nonexponential, which we argue to be related to the improved epitaxial quality of the MgO, and the, consequently, improved spin-filtering properties at larger MgO thickness. Using the TSP data to correct for this yields an exponential decay of the exchange field with tMgO with a decay length of λ=-0.42 nm. Comparing this to the decay length for the tunnel conductance (λ=-0.21 nm) suggests that the exchange interaction is dominated by two-step tunneling processes.
Publisher
American Physical Society
Source Title
Physical Review B
Volume (Issue)
107(2)
Page
024411
Date of Issued
2023-01-12
Language
English
Handle URL
https://hdl.handle.net/11094/101977
PISSN
24699950
eISSN
24699969
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1103/physrevb.107.024411
Access Rights
open access
CopyRight
© 2023 American Physical Society.
oaire:version
Version of Record
Category
学術雑誌論文 Journal Article