Token Comparison Approach to Detect Code Clone-related Bugs

Yii, YongLee; Hayase, Yasuhiro; Matsushita, Makoto et al.

電子情報通信学会技術研究報告. SS, ソフトウェアサイエンス, 2008, 107(505), 37-42

Number of Access:3382025-09-03 07:55 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/26651

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