Modulated photocarrier grating technique for diffusion length measurement in amorphous semiconductors

Hattori, K.; Koji, Y.; Fukuda, S. et al.

Journal of Applied Physics, 1993, 73(8), 3846-3851

Number of Access:8102025-08-13 20:51 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/3183

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