Identifier to cite or link to this item: https://hdl.handle.net/11094/3342

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Title	Refinement of Conditions of Point-Contact Current Imaging Atomic Force Microscopy for Molecular-Scale Conduction Measurements
Creator	CreatorName Yajima, Takashi
	NRID 1000090373191 1000090373191 CreatorName Tanaka, Hirofumi
	NRID 1000050229556 1000050229556 ORCID 0000-0002-9286-3115 0000-0002-9286-3115 researchmap permalink matsumototakuya matsumototakuya Scopus Author ID 7407959948 7407959948 CreatorName Matsumoto, Takuya
	NRID 1000070756460 1000070756460 researchmap permalink yoichiotsuka yoichiotsuka Scopus Author ID 55181504000 55181504000 ORCID 0000-0003-2304-6637 0000-0003-2304-6637 CreatorName Otsuka, Yoichi
	CreatorName Sugawara, Yoshitaka
	NRID 1000080169185 1000080169185 CreatorName Ogawa, Takuji
Publisher	Institute of Physics
Source Title	Nanotechnology
Volume (Issue)	18(9)
Page	1-5
Date of Issued	2007-03
Language	English
Handle URL	https://hdl.handle.net/11094/3342
PISSN	09574484
NCID	AA10863359
Relation.isVersionOf	DOI (Publisher Version) https://doi.org/10.1088/0957-4484/18/9/095501
Access Rights	open access
CopyRight	Copyright: Institute of Physics
oaire:version	Accepted Manuscript
Category	学術雑誌論文 Journal Article

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