Retrieving Similar Code Fragments based on Identifier Similarity for Defect Detection

Ishio, Takashi; Matsushita, Makoto; Inoue, Katsuro et al.

2008, 41-42

Number of Access:5532025-09-03 07:59 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/51558

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DEFECTS '08 Proceedings_41 pdf None 68.9 KB 328 2015.05.07 著者版/author  

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