Analytical GMD formulas for mutual inductance calculation of multilevel interconnects

Shima, Hideki; Matsuoka, Toshimasa; Taniguchi, Kenji

IEICE Electronics Express, 2006, 3(3), 44-50

Number of Access:364（2025-08-14 16:32 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/51712

Link to primary information 

File Format Terms of use Size Views Date.Available Description information
IEICE Electronics Express3_3_44 pdf None 343 KB 206 2015.05.28  

Item Information

Output File Export EndNote Basic Export Mendeley

Title
Analytical GMD formulas for mutual inductance calculation of multilevel interconnects
Creator
CreatorName
Shima, Hideki
NRID
1000080324820 1000080324820
ORCID
0000-0003-3876-2679 0000-0003-3876-2679
researchmap permalink
read0068628 read0068628
Scopus Author ID
7402741552 7402741552
CreatorName
Matsuoka, Toshimasa
NRID
1000020192180 1000020192180
CreatorName
Taniguchi, Kenji
Subject
Greenhouse method
geometric mean distance
on-chip interconnect
three-dimensional inductor
mutual inductance
closed-form expression
Abstract
A set of new analytical formulas is proposed for determining the geometric mean distance (GMD)for use in the Greenhouse method to calculate the inductances of three-dimensional inductors composed of on-chip interconnects. The expressions are derived using a graphical method based on the integral form of the GMD equation. The mutual inductances of coupled interconnects are computed for given layout geometries using the proposed formulas, even when the conductors are partially overlapped in different metal layers. The inductances computed using the formulas agreed well with those generated by an accurate commercial field solver, differing by less than 1% across a variety of the conductor geometries.
Publisher
電子情報通信学会
The Institute of Electronics, Information and Communication Engineers
デンシ　ジョウホウ　ツウシン　ガッカイ
Source Title
IEICE Electronics Express
Volume (Issue)
3(3)
Page
44-50
Date of Issued
2006-02
Language
English
Handle URL
https://hdl.handle.net/11094/51712
eISSN
13492543
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1587/elex.3.44
Access Rights
open access
CopyRight
copyright©2006 IEICE
oaire:version
Version of Record
Category
学術雑誌論文 Journal Article