Temperature dependence of energy gap of (GaAs)_n/(AlAs)_n Superlattices

Nakazawa, Takeshi; Matsuoka, Toshimasa; Ohya, Tomoki et al.

Proceedings of SPIE (1286) : International Conference on Modulation Spectroscopy, 19-21 March 1990, San Diego, California, 1990, 244-254

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Identifier to cite or link to this item: https://hdl.handle.net/11094/51724

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Title
Temperature dependence of energy gap of (GaAs)_n/(AlAs)_n Superlattices
Creator
CreatorName
Nakazawa, Takeshi
NRID
1000080324820 1000080324820
ORCID
0000-0003-3876-2679 0000-0003-3876-2679
researchmap permalink
read0068628 read0068628
Scopus Author ID
7402741552 7402741552
CreatorName
Matsuoka, Toshimasa
CreatorName
Ohya, Tomoki
NRID
1000020192180 1000020192180
CreatorName
Taniguchi, Kenji
NRID
1000040029004 1000040029004
CreatorName
Hamaguchi, Chihiro
CreatorName
Kato, Hiroshi
NRID
1000050079662 1000050079662
CreatorName
Watanabe, Yasutaka
Abstract
Photoreflectance and photoluminescence experiments are carrIed out in (GaAs)/(AlAs) (n = 1-15) in the temperature range from 25 to 275 K. Weak signals of photoreflectance associated with the critical point of the pseudodirect transition, weakly allowed direct transition arising from the zone-folding effect, have been found as well as main signals associated with the direct allowed transitions. This assignment is supported by the temperature dependence of the photoluminescence intensity, which gives the transition probability ratio of the direct allowed to pseudodirect transition about 102. Temperature dependence of the critical point energies and luminescence peak energies shows a similar behavior to bulk semiconductors. These observations show also that the monolayer number n for which the crossover of direct and pseudodirect transitions occurs depends on temperature. In addition the broadening parameters determined from photoreflectance spectra are found to be almost independent of temperature and depend on the monolayer number n, which may be explained in terms of broadening induced by the layer number fluctuation.
Publisher
SPIE
Source Title
Proceedings of SPIE (1286) : International Conference on Modulation Spectroscopy, 19-21 March 1990, San Diego, California
Page
244-254
Date of Issued
1990-08-01
Language
English
Handle URL
https://hdl.handle.net/11094/51724
Relation.isPartOf
ISBN
9780819403377
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1117/12.20852
Access Rights
open access
CopyRight
Copyright 1990 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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単行書 Book