Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning

Ibuchi, Takaaki; Funaki, Tsuyoshi

Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020, 2020

Number of Access:442（2025-08-15 22:51 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/78285

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Title
Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning
Creator
NRID
1000090755646 1000090755646
researchmap permalink
bucci bucci
Scopus Author ID
51461605600 51461605600
CreatorName
Ibuchi, Takaaki
NRID
1000020263220 1000020263220
ORCID
0000-0001-8776-5118 0000-0001-8776-5118
researchmap permalink
FunakiTsuyoshi FunakiTsuyoshi
Scopus Author ID
7005435048 7005435048
CreatorName
Funaki, Tsuyoshi
Subject
dynamic noise current behavior
near magnetic field intensity
Si IGBT
SiC MOSFET
visualization technology
Description
T. Ibuchi and T. Funaki, "Visualization of dynamic noise current distribution from Si and SiC power devices based on time-synchronized near magnetic field scanning," 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy, 2020, pp. 1-6, doi: 10.1109/EMCEUROPE48519.2020.9245654.
Abstract
This report studies the visualization of dynamic noise current distribution in switching operation of Si and SiC power devices. The measurement system is developed to identify time-dependent near magnetic field distribution for periodic steady state circuit operation. The experimental results shown in this report demonstrate the usefulness of the developed system to identify the EMI noise generation and to visualize the time variation of noise current distribution in the power conversion circuit.
Publisher
Institute of Electrical and Electronics Engineers Inc.
Source Title
Proceedings of the 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, EMC EUROPE 2020
Date of Issued
2020-09-23
Language
English
Handle URL
https://hdl.handle.net/11094/78285
Relation.isVersionOf
DOI (Publisher Version)
https://doi.org/10.1109/EMCEUROPE48519.2020.9245654
Access Rights
open access
CopyRight
© 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
oaire:version
Accepted Manuscript
Category
会議発表論文 Conference Paper