Properties of (Ti, Al) N films prepared by ion beam assisted deposition(Physics, Process, Instrument & Measurements)
Suzuki, Tsuneo; Setsuhara, Yuichi; Makino, Yukio et al.
Transactions of JWRI, 1995, 24(1), 31-37
Number of Access:661(2025-11-20 12:59 Counts)
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Identifier to cite or link to this item: https://doi.org/10.18910/8174
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2012.09.22
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