Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound

Tanigaki, Kenichi; Kusumoto, Tatsuya; Ogi, Hirotsugu; Nakamura, Nobutomo; Hirao, Masahiko

doi:https://doi.org/10.1143/JJAP.49.07HB01

Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound

Tanigaki, Kenichi; Kusumoto, Tatsuya; Ogi, Hirotsugu et al.

Japanese Journal of Applied Physics, 2010, 49, 07HB01

Number of Access:541（2025-10-09 11:45 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/84164

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Title	Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound
Creator	NRID 1000040631875 1000040631875 researchmap permalink ktanigaki ktanigaki Scopus Author ID 35853563800 35853563800 CreatorName Tanigaki, Kenichi
	CreatorName Kusumoto, Tatsuya
	NRID 1000090252626 1000090252626 researchmap permalink read0042771 read0042771 Scopus Author ID 35563683500 35563683500 CreatorName Ogi, Hirotsugu
	NRID 1000050452404 1000050452404 researchmap permalink nnakamura nnakamura Scopus Author ID 7403356186 7403356186 ORCID 0000-0002-5338-842X 0000-0002-5338-842X CreatorName Nakamura, Nobutomo
	NRID 1000080112027 1000080112027 CreatorName Hirao, Masahiko
Description	Kenichi Tanigaki, Tatsuya Kusumoto, Hirotsugu Ogi, Nobutomo Nakamura and Masahiko Hirao. Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound. Japanese Journal of Applied Physics, 2010, 49(7S), 07HB01. https://doi.org/10.1143/JJAP.49.07HB01.
Abstract	In this paper, a picosecond ultrasound measurement is conducted to evaluate the low-temperature elastic and optical properties of thin films and semiconductors. Specimens are cooled with liquid He through a heat exchanger in a cryostat, and an ultrahigh-frequency acoustic pulse is generated using a femtosecond light pulse, which propagates in the film-thickness direction. Pulse echoes of the longitudinal wave and Brillouin oscillation are observed by the changes in reflectivity of the time-delayed probe light, which depend on the material, and give the longitudinal-wave out-of-plane elastic constant. When the stiffness is known, the Brillouin oscillation provides the refractive index. We determined the stiffness of a Pt thin film and the refractive index of Si at 5 K. The methodology developed in this paper is useful for studing the elastic and optical properties of metallic thin films and transparent materials at cryogenic temperatures.
Publisher	The Japan Society of Applied Physics
Source Title	Japanese Journal of Applied Physics
Volume (Issue)	49
Page	07HB01
Date of Issued	2010-07-20
Language	English
Handle URL	https://hdl.handle.net/11094/84164
PISSN	00214922
eISSN	13474065
NCID	AA12295836
Relation.isVersionOf	DOI (Publisher Version) https://doi.org/10.1143/JJAP.49.07HB01
Access Rights	open access
oaire:version	Accepted Manuscript
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Japanese Journal of Applied Physics. 2010, 49, p. 07HB01
DC.title	Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound
DC.creator	Tanigaki, Kenichi
	Kusumoto, Tatsuya
	Ogi, Hirotsugu
	Nakamura, Nobutomo
	Hirao, Masahiko
DC.publisher	The Japan Society of Applied Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2010-07-20
DC.identifier	https://doi.org/10.1143/JJAP.49.07HB01
DC.description	Kenichi Tanigaki, Tatsuya Kusumoto, Hirotsugu Ogi, Nobutomo Nakamura and Masahiko Hirao. Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound. Japanese Journal of Applied Physics, 2010, 49(7S), 07HB01. https://doi.org/10.1143/JJAP.49.07HB01.
DCTERMS.abstract	In this paper, a picosecond ultrasound measurement is conducted to evaluate the low-temperature elastic and optical properties of thin films and semiconductors. Specimens are cooled with liquid He through a heat exchanger in a cryostat, and an ultrahigh-frequency acoustic pulse is generated using a femtosecond light pulse, which propagates in the film-thickness direction. Pulse echoes of the longitudinal wave and Brillouin oscillation are observed by the changes in reflectivity of the time-delayed probe light, which depend on the material, and give the longitudinal-wave out-of-plane elastic constant. When the stiffness is known, the Brillouin oscillation provides the refractive index. We determined the stiffness of a Pt thin film and the refractive index of Si at 5 K. The methodology developed in this paper is useful for studing the elastic and optical properties of metallic thin films and transparent materials at cryogenic temperatures.
DC.format	84164
citation_title	Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound
citation_author	Tanigaki, Kenichi
	Kusumoto, Tatsuya
	Ogi, Hirotsugu
	Nakamura, Nobutomo
	Hirao, Masahiko
citation_publisher	The Japan Society of Applied Physics
citation_language	English
citation_date	2010-07-20
citation_journal_title	Japanese Journal of Applied Physics
citation_volume	49
citation_firstpage	07HB01
citation_doi	https://doi.org/10.1143/JJAP.49.07HB01
citation_public_url	https://hdl.handle.net/11094/84164

Measurement of elastic constant and refraction index of thin films at low temperatures using picosecond ultrasound

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