Elastic-stiffness mapping by resonance-ultrasound microscopy with isolated piezoelectric oscillator

Ogi, Hirotsugu; Tian, Jiayong; Tada, Toyokazu et al.

Applied Physics Letters, 2003, 83(3), 464-466

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Identifier to cite or link to this item: https://hdl.handle.net/11094/84203

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Title
Elastic-stiffness mapping by resonance-ultrasound microscopy with isolated piezoelectric oscillator
Creator
NRID
1000090252626 1000090252626
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Scopus Author ID
35563683500 35563683500
CreatorName
Ogi, Hirotsugu
CreatorName
Tian, Jiayong
CreatorName
Tada, Toyokazu
NRID
1000080112027 1000080112027
CreatorName
Hirao, Masahiko
Description
Ogi H., Tian J., Tada T., et al. "Elastic-stiffness mapping by resonance-ultrasound microscopy with isolated piezoelectric oscillator", Applied Physics Letters, 83(3), 464 (2003) https://doi.org/10.1063/1.1593819.
Abstract
A resonance-ultrasound microscopy has been developed for mapping a material’s elastic constant in a localized surface region. It detects the effective elastic modulus through a resonance frequency of free vibrations of a solid probe touching the specimen via a small tungsten-carbide bearing. Langasite (La3Ga5SiO14) crystal is used as a probe because of the low sensitivity of its elastic constants to temperature and its high piezoelectric coefficients. The vibration of the probe is excited and detected with a surrounding solenoid coil. This noncontacting acoustic coupling isolates the probe vibration and measures the resonance frequency with an accuracy better than one part in 105. This microscopic method is applied to a composite material consisting of silicon-carbide (SiC) fibers in titanium-alloy matrix. The stiffness distribution inside a single fiber was determined.
Publisher
American Institute of Physics
Source Title
Applied Physics Letters
Volume (Issue)
83(3)
Page
464-466
Date of Issued
2003-07-21
Language
English
Handle URL
https://hdl.handle.net/11094/84203
PISSN
00036951
eISSN
10773118
NCID
AA00543431
AA11868096
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1063/1.1593819
Access Rights
open access
CopyRight
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 83(3), 464 (2003) and may be found at https://doi.org/10.1063/1.1593819.
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Category
学術雑誌論文 Journal Article