Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

Ogi, H.; Fujii, M.; Nakamura, N.; Shagawa, T.; Hirao, M.

doi:https://doi.org/10.1063/1.2737819

Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

Ogi, H.; Fujii, M.; Nakamura, N. et al.

Applied Physics Letters, 2007, 90(19), 191906-1-191906-3

Number of Access:690（2025-10-09 11:45 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/84208

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Title	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
Creator	NRID 1000090252626 1000090252626 researchmap permalink read0042771 read0042771 Scopus Author ID 35563683500 35563683500 CreatorName Ogi, H.
	CreatorName Fujii, M.
	NRID 1000050452404 1000050452404 researchmap permalink nnakamura nnakamura Scopus Author ID 7403356186 7403356186 ORCID 0000-0002-5338-842X 0000-0002-5338-842X CreatorName Nakamura, N.
	CreatorName Shagawa, T.
	NRID 1000080112027 1000080112027 CreatorName Hirao, M.
Description	Ogi H., Fujii M., Nakamura N., et al. "Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films", Applied Physics Letters, 90(19), 191906 (2007) https://doi.org/10.1063/1.2737819.
Abstract	Ultrahigh-frequency phonon resonances were excited in ultrathin films (∼5 nm) by femtosecond light pulses, and their resonance frequencies were measured to determine the through-thickness elastic constants. The studied materials were Pt and Fe. The elastic stiffness increases with decreasing film thickness for both materials, whereas the normal strain showed opposite thickness behavior. Analysis of the wave propagation using the third-order elastic constants explained these trends. © 2007 American Institute of Physics.
Publisher	American Institute of Physics
Source Title	Applied Physics Letters
Volume (Issue)	90(19)
Page	191906-1-191906-3
Date of Issued	2007-05-07
Language	English
Handle URL	https://hdl.handle.net/11094/84208
PISSN	00036951
eISSN	10773118
NCID	AA00543431
NCID	AA11868096
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1063/1.2737819
Access Rights	open access
CopyRight	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 90(19), 191906 (2007) and may be found at https://doi.org/10.1063/1.2737819.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Applied Physics Letters. 2007, 90(19), p. 191906-1-191906-3
DC.title	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
DC.creator	Ogi, H.
	Fujii, M.
	Nakamura, N.
	Shagawa, T.
	Hirao, M.
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2007-05-07
DC.identifier	https://doi.org/10.1063/1.2737819
DC.description	Ogi H., Fujii M., Nakamura N., et al. "Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films", Applied Physics Letters, 90(19), 191906 (2007) https://doi.org/10.1063/1.2737819.
DCTERMS.abstract	Ultrahigh-frequency phonon resonances were excited in ultrathin films (∼5 nm) by femtosecond light pulses, and their resonance frequencies were measured to determine the through-thickness elastic constants. The studied materials were Pt and Fe. The elastic stiffness increases with decreasing film thickness for both materials, whereas the normal strain showed opposite thickness behavior. Analysis of the wave propagation using the third-order elastic constants explained these trends. © 2007 American Institute of Physics.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 90(19), 191906 (2007) and may be found at https://doi.org/10.1063/1.2737819.
DC.format	84208
citation_title	Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films
citation_author	Ogi, H.
	Fujii, M.
	Nakamura, N.
	Shagawa, T.
	Hirao, M.
citation_publisher	American Institute of Physics
citation_language	English
citation_date	2007-05-07
citation_journal_title	Applied Physics Letters
citation_volume	90
citation_issue	19
citation_firstpage	191906-1
citation_lastpage	191906-3
citation_doi	https://doi.org/10.1063/1.2737819
citation_public_url	https://hdl.handle.net/11094/84208

Resonance acoustic-phonon spectroscopy for studying elasticity of ultrathin films

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