Young's modulus mapping on SCS-6 SiCf/Ti-6Al-4V composite by electromagnetic-resonance-ultrasound microscopy

Tian, Jiayong; Ogi, Hirotsugu; Tada, Toyokazu et al.

Journal of Applied Physics, 2003, 94(10), 6472-6476

Number of Access:2452025-11-25 02:19 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/84218

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