Fast recovery of elastic constant in thin films studied by resonant-ultrasound spectroscopy

Nakamura, N.; Nakashima, T.; Ogi, H. et al.

Journal of Applied Physics, 2010, 107(10), 103541-1-103541-4

Number of Access:5972025-08-14 17:56 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/84227

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