Quantitative imaging of Young's modulus of solids: A contact-mechanics study

Ogi, H.; Inoue, T.; Nagai, H. et al.

Review of Scientific Instruments, 2008, 79(5), 053701-1-053701-8

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Identifier to cite or link to this item: https://hdl.handle.net/11094/84236

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Title
Quantitative imaging of Young's modulus of solids: A contact-mechanics study
Creator
NRID
1000090252626 1000090252626
researchmap permalink
read0042771 read0042771
Scopus Author ID
35563683500 35563683500
ORCID
0000-0002-9602-5194 0000-0002-9602-5194
CreatorName
Ogi, H.
CreatorName
Inoue, T.
NRID
1000070110848 1000070110848
CreatorName
Nagai, H.
NRID
1000080112027 1000080112027
CreatorName
Hirao, M.
Description
Ogi H., Inoue T., Nagai H., et al. "Quantitative imaging of Young's modulus of solids: A contact-mechanics study", Review of Scientific Instruments, 79(5), 053701 (2008) https://doi.org/10.1063/1.2908437.
Abstract
We developed equipment and methods for measuring quantitatively the local Young's modulus of solids. It consists of an electrodeless langasite oscillator and line antennas, and oscillator vibrations are generated and detected contactlessly. A constant biasing force results from oscillator mass and is independent of surface roughness. The effect of material anisotropy on the measured stiffness is theoretically discussed for studying the limitation of the quantitative measurement. The microscopy has been applied to polycrystalline copper, and the measured modulus is compared to calculations based on electron-backscatter-diffraction measurements. Also, we applied it to a duplex stainless steel and an embedded silicon-carbide fiber. The results reveal textured regions, defects with high sensitivity, and even stiffness distribution in a single grain. © 2008 American Institute of Physics.
Publisher
American Institute of Physics
Source Title
Review of Scientific Instruments
Volume (Issue)
79(5)
Page
053701-1-053701-8
Date of Issued
2008-05-15
Language
English
Handle URL
https://hdl.handle.net/11094/84236
PISSN
00346748
eISSN
10897623
NCID
AA00817730
AA12442307
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1063/1.2908437
Access Rights
open access
CopyRight
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Review of Scientific Instruments, 79(5), 053701 (2008) and may be found at https://doi.org/10.1063/1.2908437.
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Category
学術雑誌論文 Journal Article