Defect imaging with guided waves propagating in a long range

Hayashi, Takahiro; Nagao, Masahiro; Murase, Morimasa

Journal of Solid Mechanics and Materials Engineering, 2008, 2(7), 888-899

Number of Access:1842025-06-07 18:47 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/84516

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