Residual stress generated by LBW on HT780

Kim, You-Chul; Hirohata, Mikihito

Transactions of JWRI, 2010, 39(2), 68-70

Number of Access:2872025-07-27 20:18 Counts

Identifier to cite or link to this item: https://doi.org/10.18910/8532

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jwri39_02_068 pdf None 376 KB 203 2012.09.22  

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