High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

Takahashi, Yukio; Suzuki, Akihiro; Furutaku, Shin; Yamauchi, Kazuto; Kohmura, Yoshiki; Ishikawa, Tetsuya

doi:https://doi.org/10.1063/1.4794063

High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

Takahashi, Yukio; Suzuki, Akihiro; Furutaku, Shin et al.

Applied Physics Letters, 2013, 102(9), 094102

Number of Access:660（2025-08-14 15:05 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86928

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Title	High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter
Creator	NRID 1000000415217 1000000415217 CreatorName Takahashi, Yukio
	CreatorName Suzuki, Akihiro
	CreatorName Furutaku, Shin
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
	NRID 1000030270599 1000030270599 CreatorName Kohmura, Yoshiki
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, Tetsuya
Description	Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, and Tetsuya Ishikawa, "High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter", Appl. Phys. Lett. 102, 094102 (2013) https://doi.org/10.1063/1.4794063.
Abstract	We demonstrate high-resolution and high-sensitivity x-ray phase-contrast imaging of a weakly scattering extended object by scanning coherent diffractive imaging, i.e., ptychography, using a focused x-ray beam with a spatial filter. We develop the x-ray illumination optics installed with the spatial filter to collect coherent diffraction patterns with a high signal-to-noise ratio. We quantitatively visualize the object with a slight phase shift ([formula omitted]) at spatial resolution better than 17 nm in a field of view larger than [formula omitted]. The present coherent method has a marked potential for high-resolution and wide-field-of-view observation of weakly scattering objects such as biological soft tissues.
Publisher	American Institute of Physics
Source Title	Applied Physics Letters
Volume (Issue)	102(9)
Page	094102
Date of Issued	2013-03-04
Language	English
Handle URL	https://hdl.handle.net/11094/86928
PISSN	00036951
eISSN	10773118
NCID	AA00543431
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1063/1.4794063
Access Rights	open access
CopyRight	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.4794063.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Applied Physics Letters. 2013, 102(9), p. 094102
DC.title	High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter
DC.creator	Takahashi, Yukio
	Suzuki, Akihiro
	Furutaku, Shin
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2013-03-04
DC.identifier	https://doi.org/10.1063/1.4794063
DC.description	Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, and Tetsuya Ishikawa, "High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter", Appl. Phys. Lett. 102, 094102 (2013) https://doi.org/10.1063/1.4794063.
DCTERMS.abstract	We demonstrate high-resolution and high-sensitivity x-ray phase-contrast imaging of a weakly scattering extended object by scanning coherent diffractive imaging, i.e., ptychography, using a focused x-ray beam with a spatial filter. We develop the x-ray illumination optics installed with the spatial filter to collect coherent diffraction patterns with a high signal-to-noise ratio. We quantitatively visualize the object with a slight phase shift ([formula omitted]) at spatial resolution better than 17 nm in a field of view larger than [formula omitted]. The present coherent method has a marked potential for high-resolution and wide-field-of-view observation of weakly scattering objects such as biological soft tissues.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.4794063.
DC.format	86928
citation_title	High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter
citation_author	Takahashi, Yukio
	Suzuki, Akihiro
	Furutaku, Shin
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
citation_publisher	American Institute of Physics
citation_language	English
citation_date	2013-03-04
citation_journal_title	Applied Physics Letters
citation_volume	102
citation_issue	9
citation_firstpage	094102
citation_doi	https://doi.org/10.1063/1.4794063
citation_public_url	https://hdl.handle.net/11094/86928

High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

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