Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

Takahashi, Yukio; Suzuki, Akihiro; Furutaku, Shin; Yamauchi, Kazuto; Kohmura, Yoshiki; Ishikawa, Tetsuya

doi:https://doi.org/10.1103/PhysRevB.87.121201

Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

Takahashi, Yukio; Suzuki, Akihiro; Furutaku, Shin et al.

Physical Review B, 2013, 87(12), 121201

Number of Access:679（2025-08-14 12:35 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86934

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Title	Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam
Creator	NRID 1000000415217 1000000415217 CreatorName Takahashi, Yukio
	CreatorName Suzuki, Akihiro
	CreatorName Furutaku, Shin
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
	NRID 1000030270599 1000030270599 CreatorName Kohmura, Yoshiki
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, Tetsuya
Description	Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, and Tetsuya Ishikawa, Phys. Rev. B 87, 121201, 2013.
Abstract	We experimentally demonstrate the visualization of nanoscale dislocation strain fields in a thick silicon single crystal by a coherent diffraction imaging technique called Bragg x-ray ptychography. We also propose that the x-ray microbeam carrying orbital angular momentum is selectively produced by coherent Bragg diffraction from dislocation singularities in crystals. This work not only provides us with a tool for characterizing dislocation strain fields buried within extended crystals but also opens up new scientific opportunities in femtosecond spectroscopy using x-ray free-electron lasers.
Publisher	American Physical Society
Source Title	Physical Review B
Volume (Issue)	87(12)
Page	121201
Date of Issued	2013-03-07
Language	English
Handle URL	https://hdl.handle.net/11094/86934
PISSN	10980121
eISSN	1550235X
NCID	AA11187113
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1103/PhysRevB.87.121201
Access Rights	open access
CopyRight	Copyright 2013 by the American Physical Society
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Physical Review B. 2013, 87(12), p. 121201
DC.title	Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam
DC.creator	Takahashi, Yukio
	Suzuki, Akihiro
	Furutaku, Shin
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
DC.publisher	American Physical Society
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2013-03-07
DC.identifier	https://doi.org/10.1103/PhysRevB.87.121201
DC.description	Yukio Takahashi, Akihiro Suzuki, Shin Furutaku, Kazuto Yamauchi, Yoshiki Kohmura, and Tetsuya Ishikawa, Phys. Rev. B 87, 121201, 2013.
DCTERMS.abstract	We experimentally demonstrate the visualization of nanoscale dislocation strain fields in a thick silicon single crystal by a coherent diffraction imaging technique called Bragg x-ray ptychography. We also propose that the x-ray microbeam carrying orbital angular momentum is selectively produced by coherent Bragg diffraction from dislocation singularities in crystals. This work not only provides us with a tool for characterizing dislocation strain fields buried within extended crystals but also opens up new scientific opportunities in femtosecond spectroscopy using x-ray free-electron lasers.
DC.rights	Copyright 2013 by the American Physical Society
DC.format	86934
citation_title	Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam
citation_author	Takahashi, Yukio
	Suzuki, Akihiro
	Furutaku, Shin
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
citation_publisher	American Physical Society
citation_language	English
citation_date	2013-03-07
citation_journal_title	Physical Review B
citation_volume	87
citation_issue	12
citation_firstpage	121201
citation_doi	https://doi.org/10.1103/PhysRevB.87.121201
citation_public_url	https://hdl.handle.net/11094/86934

Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam

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