High-resolution multislice X-ray ptychography of extended thick objects

Suzuki, Akihiro; Furutaku, Shin; Shimomura, Kei; Yamauchi, Kazuto; Kohmura, Yoshiki; Ishikawa, Tetsuya; Takahashi, Yukio

doi:https://doi.org/10.1103/PhysRevLett.112.053903

High-resolution multislice X-ray ptychography of extended thick objects

Suzuki, Akihiro; Furutaku, Shin; Shimomura, Kei et al.

Physical Review Letters, 2014, 112(5), 053903

Number of Access:703（2025-08-15 10:59 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86935

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Title	High-resolution multislice X-ray ptychography of extended thick objects
Creator	CreatorName Suzuki, Akihiro
	CreatorName Furutaku, Shin
	CreatorName Shimomura, Kei
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
	NRID 1000030270599 1000030270599 CreatorName Kohmura, Yoshiki
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, Tetsuya
	NRID 1000000415217 1000000415217 CreatorName Takahashi, Yukio
Description	Akihiro Suzuki, Shin Furutaku, Kei Shimomura, Kazuto Yamauchi, Yoshiki Kohmura, Tetsuya Ishikawa, and Yukio Takahashi, Phys. Rev. Lett. 112, 053903, 2014.
Abstract	We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105 μm gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at ∼50 nm resolution using a multislice approach, while the resolution was worse than ∼192 nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.
Publisher	American Physical Society
Source Title	Physical Review Letters
Volume (Issue)	112(5)
Page	053903
Date of Issued	2014-02-04
Language	English
Handle URL	https://hdl.handle.net/11094/86935
PISSN	00319007
eISSN	10797114
NCID	AA00773679
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1103/PhysRevLett.112.053903
Access Rights	open access
CopyRight	Copyright 2014 by the American Physical Society
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Physical Review Letters. 2014, 112(5), p. 053903
DC.title	High-resolution multislice X-ray ptychography of extended thick objects
DC.creator	Suzuki, Akihiro
	Furutaku, Shin
	Shimomura, Kei
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
	Takahashi, Yukio
DC.publisher	American Physical Society
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2014-02-04
DC.identifier	https://doi.org/10.1103/PhysRevLett.112.053903
DC.description	Akihiro Suzuki, Shin Furutaku, Kei Shimomura, Kazuto Yamauchi, Yoshiki Kohmura, Tetsuya Ishikawa, and Yukio Takahashi, Phys. Rev. Lett. 112, 053903, 2014.
DCTERMS.abstract	We report the first demonstration of hard x-ray ptychography using a multislice approach, which can solve the problem of the limited spatial resolution under the projection approximation. We measured ptychographic diffraction patterns of a two-layered object with a 105 μm gap using 7 keV focused coherent x rays. We successfully reconstructed the phase map of each layer at ∼50 nm resolution using a multislice approach, while the resolution was worse than ∼192 nm under the projection approximation. The present method has the potential to enable the three-dimensional high-resolution observation of extended thick specimens in materials science and biology.
DC.rights	Copyright 2014 by the American Physical Society
DC.format	86935
citation_title	High-resolution multislice X-ray ptychography of extended thick objects
citation_author	Suzuki, Akihiro
	Furutaku, Shin
	Shimomura, Kei
	Yamauchi, Kazuto
	Kohmura, Yoshiki
	Ishikawa, Tetsuya
	Takahashi, Yukio
citation_publisher	American Physical Society
citation_language	English
citation_date	2014-02-04
citation_journal_title	Physical Review Letters
citation_volume	112
citation_issue	5
citation_firstpage	053903
citation_doi	https://doi.org/10.1103/PhysRevLett.112.053903
citation_public_url	https://hdl.handle.net/11094/86935

High-resolution multislice X-ray ptychography of extended thick objects

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