Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Koyama, T.; Yumoto, H.; Tono, K.; Sato, T.; Togashi, T.; Inubushi, Y.; Katayama, T.; Kim, J.; Matsuyama, S.; Mimura, H.; Yabashi, M.; Yamauchi, K.; Ohashi, H.

doi:https://doi.org/10.1117/12.2025377

Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Koyama, T.; Yumoto, H.; Tono, K. et al.

Proceedings of SPIE - The International Society for Optical Engineering, 2013, 8848, 88480T

Number of Access:1,307（2025-08-15 06:46 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86938

Link to primary information

File	Format	Terms of use	Size	Views	Date.Available	Description	information
153384_1	pdf	None	1.17 MB	130	2022.03.28

Item Information

Output File Export EndNote Basic Export Mendeley

Title	Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser
Creator	NRID 1000020468276 1000020468276 CreatorName Koyama, T.
	NRID 1000020423197 1000020423197 CreatorName Yumoto, H.
	NRID 1000000353508 1000000353508 CreatorName Tono, K.
	CreatorName Sato, T.
	NRID 1000060415239 1000060415239 CreatorName Togashi, T.
	NRID 1000040506250 1000040506250 CreatorName Inubushi, Y.
	NRID 1000090648073 1000090648073 CreatorName Katayama, T.
	CreatorName Kim, J.
	NRID 1000010423196 1000010423196 CreatorName Matsuyama, S.
	NRID 1000030362651 1000030362651 CreatorName Mimura, H.
	NRID 1000000372144 1000000372144 CreatorName Yabashi, M.
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, K.
	NRID 1000030443550 1000030443550 CreatorName Ohashi, H.
Subject	X-ray free electron laser
	Focusing mirror
	Ablation
	Damage threshold
	Hard X-ray
Description	T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377.
Publisher	The International Society for Optical Engineering
Source Title	Proceedings of SPIE - The International Society for Optical Engineering
Volume (Issue)	8848
Page	88480T
Date of Issued	2013-09-27
Language	English
Handle URL	https://hdl.handle.net/11094/86938
PISSN	0277786X
eISSN	1996756X
NCID	AA10619755
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1117/12.2025377
Access Rights	open access
CopyRight	Copyright 2013 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.
oaire:version	Version of Record
Category	会議発表論文 Conference Paper

Resource Type	conference paper
Local Type	Conference Paper
DCMI Type	Text
DCTERMS.bibliographicCitation	Proceedings of SPIE - The International Society for Optical Engineering. 2013, 8848, p. 88480T
DC.title	Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser
DC.creator	Koyama, T.
	Yumoto, H.
	Tono, K.
	Sato, T.
	Togashi, T.
	Inubushi, Y.
	Katayama, T.
	Kim, J.
	Matsuyama, S.
	Mimura, H.
	Yabashi, M.
	Yamauchi, K.
	Ohashi, H.
DC.publisher	The International Society for Optical Engineering
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2013-09-27
DC.identifier	https://doi.org/10.1117/12.2025377
DC.subject	X-ray free electron laser
	Focusing mirror
	Ablation
	Damage threshold
	Hard X-ray
DC.description	T. Koyama, H. Yumoto, K. Tono, T. Sato, T. Togashi, Y. Inubushi, T. Katayama, J. Kim, S. Matsuyama, H. Mimura, M. Yabashi, K. Yamauchi, and H. Ohashi "Damage threshold investigation using grazing incidence irradiation by hard x-ray free electron laser", Proc. SPIE 8848, Advances in X-Ray/EUV Optics and Components VIII, 88480T (27 September 2013); https://doi.org/10.1117/12.2025377.
DC.rights	Copyright 2013 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.
DC.format	86938
citation_title	Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser
citation_author	Koyama, T.
	Yumoto, H.
	Tono, K.
	Sato, T.
	Togashi, T.
	Inubushi, Y.
	Katayama, T.
	Kim, J.
	Matsuyama, S.
	Mimura, H.
	Yabashi, M.
	Yamauchi, K.
	Ohashi, H.
citation_publisher	The International Society for Optical Engineering
citation_language	English
citation_date	2013-09-27
citation_journal_title	Proceedings of SPIE - The International Society for Optical Engineering
citation_volume	8848
citation_firstpage	88480T
citation_doi	https://doi.org/10.1117/12.2025377
citation_public_url	https://hdl.handle.net/11094/86938

Damage threshold investigation using grazing incidence irradiation by hard X-ray free electron laser

Link to primary information

Item Information

Show details