Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy

Matsuyama, S.; Emi, Y.; Kino, H.; Kohmura, Y.; Yabashi, M.; Ishikawa, T.; Yamauchi, K.

doi:https://doi.org/10.1117/12.2060783

Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy

Matsuyama, S.; Emi, Y.; Kino, H. et al.

Proceedings of SPIE - The International Society for Optical Engineering, 2014, 9207, 92070Q

Number of Access:805（2025-08-15 10:59 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86943

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Title	Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy
Creator	NRID 1000010423196 1000010423196 CreatorName Matsuyama, S.
	CreatorName Emi, Y.
	CreatorName Kino, H.
	NRID 1000030270599 1000030270599 CreatorName Kohmura, Y.
	NRID 1000000372144 1000000372144 CreatorName Yabashi, M.
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, T.
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, K.
Subject	advanced Kirkpatrick–Baez optics
	Wolter mirror
	full-field X-ray microscopy
	X-ray mirror
	XANES
Description	S. Matsuyama, Y. Emi, H. Kino, Y. Kohmura, M. Yabashi, T. Ishikawa, and K. Yamauchi "Development of achromatic full-field hard x-ray microscopy and its application to x-ray absorption near edge structure spectromicroscopy", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070Q (5 September 2014); https://doi.org/10.1117/12.2060783.
Publisher	The International Society for Optical Engineering
Source Title	Proceedings of SPIE - The International Society for Optical Engineering
Volume (Issue)	9207
Page	92070Q
Date of Issued	2014-09-05
Language	English
Handle URL	https://hdl.handle.net/11094/86943
PISSN	0277786X
eISSN	1996756X
NCID	AA10619755
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1117/12.2060783
Access Rights	open access
CopyRight	Copyright 2014 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.
oaire:version	Version of Record
Category	会議発表論文 Conference Paper

Resource Type	conference paper
Local Type	Conference Paper
DCMI Type	Text
DCTERMS.bibliographicCitation	Proceedings of SPIE - The International Society for Optical Engineering. 2014, 9207, p. 92070Q
DC.title	Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy
DC.creator	Matsuyama, S.
	Emi, Y.
	Kino, H.
	Kohmura, Y.
	Yabashi, M.
	Ishikawa, T.
	Yamauchi, K.
DC.publisher	The International Society for Optical Engineering
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2014-09-05
DC.identifier	https://doi.org/10.1117/12.2060783
DC.subject	advanced Kirkpatrick–Baez optics
	Wolter mirror
	full-field X-ray microscopy
	X-ray mirror
	XANES
DC.description	S. Matsuyama, Y. Emi, H. Kino, Y. Kohmura, M. Yabashi, T. Ishikawa, and K. Yamauchi "Development of achromatic full-field hard x-ray microscopy and its application to x-ray absorption near edge structure spectromicroscopy", Proc. SPIE 9207, Advances in X-Ray/EUV Optics and Components IX, 92070Q (5 September 2014); https://doi.org/10.1117/12.2060783.
DC.rights	Copyright 2014 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, or modification of the contents of the publication are prohibited.
DC.format	86943
citation_title	Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy
citation_author	Matsuyama, S.
	Emi, Y.
	Kino, H.
	Kohmura, Y.
	Yabashi, M.
	Ishikawa, T.
	Yamauchi, K.
citation_publisher	The International Society for Optical Engineering
citation_language	English
citation_date	2014-09-05
citation_journal_title	Proceedings of SPIE - The International Society for Optical Engineering
citation_volume	9207
citation_firstpage	92070Q
citation_doi	https://doi.org/10.1117/12.2060783
citation_public_url	https://hdl.handle.net/11094/86943

Development of achromatic full-field hard X-ray microscopy and its application to X-ray absorption near edge structure spectromicroscopy

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