Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

Inubushi, Yuichi; Inoue, Ichiro; Kim, Jangwoo; Nishihara, Akihiko; Matsuyama, Satoshi; Yumoto, Hirokatsu; Koyama, Takahisa; Tono, Kensuke; Ohashi, Haruhiko; Yamauchi, Kazuto; Yabashi, Makina

doi:https://doi.org/10.3390/app7060584

Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

Inubushi, Yuichi; Inoue, Ichiro; Kim, Jangwoo et al.

Applied Sciences, 2017, 7(6), 584

Number of Access:1,228（2025-08-16 00:38 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86956

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Title	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
Creator	NRID 1000040506250 1000040506250 CreatorName Inubushi, Yuichi
	NRID 1000030783401 1000030783401 CreatorName Inoue, Ichiro
	CreatorName Kim, Jangwoo
	CreatorName Nishihara, Akihiko
	NRID 1000010423196 1000010423196 CreatorName Matsuyama, Satoshi
	NRID 1000020423197 1000020423197 CreatorName Yumoto, Hirokatsu
	NRID 1000020468276 1000020468276 CreatorName Koyama, Takahisa
	NRID 1000000353508 1000000353508 CreatorName Tono, Kensuke
	NRID 1000030443550 1000030443550 CreatorName Ohashi, Haruhiko
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
	NRID 1000000372144 1000000372144 CreatorName Yabashi, Makina
Subject	XFEL
	spectroscopy
	ultra-shot pulse
Description	Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584. https://doi.org/10.3390/app7060584.
Abstract	We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
Publisher	MDPI
Source Title	Applied Sciences
Volume (Issue)	7(6)
Page	584
Date of Issued	2017-06-06
Language	English
Handle URL	https://hdl.handle.net/11094/86956
eISSN	20763417
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.3390/app7060584
Access Rights	open access
CopyRight	This article is licensed under a Creative Commons Attribution 4.0 International License.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Applied Sciences. 2017, 7(6), p. 584
DC.title	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
DC.creator	Inubushi, Yuichi
	Inoue, Ichiro
	Kim, Jangwoo
	Nishihara, Akihiko
	Matsuyama, Satoshi
	Yumoto, Hirokatsu
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yamauchi, Kazuto
	Yabashi, Makina
DC.publisher	MDPI
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2017-06-06
DC.identifier	https://doi.org/10.3390/app7060584
DC.subject	XFEL
	spectroscopy
	ultra-shot pulse
DC.description	Inubushi, Y.; Inoue, I.; Kim, J.; Nishihara, A.; Matsuyama, S.; Yumoto, H.; Koyama, T.; Tono, K.; Ohashi, H.; Yamauchi, K.; Yabashi, M. Measurement of the X-ray Spectrum of a Free Electron Laser with a Wide-Range High-Resolution Single-Shot Spectrometer. Appl. Sci. 2017, 7, 584. https://doi.org/10.3390/app7060584.
DCTERMS.abstract	We developed a single-shot X-ray spectrometer for wide-range high-resolution measurements of Self-Amplified Spontaneous Emission (SASE) X-ray Free Electron Laser (XFEL) pulses. The spectrometer consists of a multi-layer elliptical mirror for producing a large divergence of 22 mrad around 9070 eV and a silicon (553) analyzer crystal. We achieved a wide energy range of 55 eV with a fine spectral resolution of 80 meV, which enabled the observation of a whole SASE-XFEL spectrum with fully-resolved spike structures. We found that a SASE-XFEL pulse has around 60 longitudinal modes with a pulse duration of 7.7 ± 1.1 fs.
DC.rights	This article is licensed under a Creative Commons Attribution 4.0 International License.
DC.format	86956
citation_title	Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer
citation_author	Inubushi, Yuichi
	Inoue, Ichiro
	Kim, Jangwoo
	Nishihara, Akihiko
	Matsuyama, Satoshi
	Yumoto, Hirokatsu
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yamauchi, Kazuto
	Yabashi, Makina
citation_publisher	MDPI
citation_language	English
citation_date	2017-06-06
citation_journal_title	Applied Sciences
citation_volume	7
citation_issue	6
citation_firstpage	584
citation_doi	https://doi.org/10.3390/app7060584
citation_public_url	https://hdl.handle.net/11094/86956

Measurement of the X-ray spectrum of a free electron laser with a wide-range high-resolution single-shot spectrometer

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