Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

Inoue, Takato; Matsuyama, Satoshi; Kawai, Shogo; Yumoto, Hirokatsu; Inubushi, Yuichi; Osaka, Taito; Inoue, Ichiro; Koyama, Takahisa; Tono, Kensuke; Ohashi, Haruhiko; Yabashi, Makina; Ishikawa, Tetsuya; Yamauchi, Kazuto

doi:https://doi.org/10.1063/1.5026440

Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

Inoue, Takato; Matsuyama, Satoshi; Kawai, Shogo et al.

Review of Scientific Instruments, 2018, 89(4), 043106

Number of Access:1,267（2025-10-11 10:25 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86965

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Title	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
Creator	CreatorName Inoue, Takato
	NRID 1000010423196 1000010423196 CreatorName Matsuyama, Satoshi
	CreatorName Kawai, Shogo
	NRID 1000020423197 1000020423197 CreatorName Yumoto, Hirokatsu
	NRID 1000040506250 1000040506250 CreatorName Inubushi, Yuichi
	NRID 1000070782887 1000070782887 CreatorName Osaka, Taito
	NRID 1000030783401 1000030783401 CreatorName Inoue, Ichiro
	NRID 1000020468276 1000020468276 CreatorName Koyama, Takahisa
	NRID 1000000353508 1000000353508 CreatorName Tono, Kensuke
	NRID 1000030443550 1000030443550 CreatorName Ohashi, Haruhiko
	NRID 1000000372144 1000000372144 CreatorName Yabashi, Makina
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, Tetsuya
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
Description	Takato Inoue, Satoshi Matsuyama, Shogo Kawai, Hirokatsu Yumoto, Yuichi Inubushi, Taito Osaka, Ichiro Inoue, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi, "Systematic-error-free wavefront measurement using an X-ray single-grating interferometer", Review of Scientific Instruments 89, 043106 (2018), https://doi.org/10.1063/1.5026440.
Abstract	In this study, the systematic errors of an X-ray single-grating interferometer based on the Talbot effect were investigated in detail. Non-negligible systematic errors induced by an X-ray camera were identified and a method to eliminate the systematic error was proposed. Systematic-error-free measurements of the wavefront error produced by multilayer focusing mirrors with large numerical apertures were demonstrated at the SPring-8 Angstrom Compact free electron LAser. Consequently, wavefront aberration obtained with two different cameras was found to be consistent with an accuracy better than λ/12.
Publisher	American Institute of Physics
Source Title	Review of Scientific Instruments
Volume (Issue)	89(4)
Page	043106
Date of Issued	2018-04-26
Language	English
Handle URL	https://hdl.handle.net/11094/86965
PISSN	00346748
eISSN	10897623
NCID	AA00817730
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1063/1.5026440
Relation.isIdenticalTo	PMID 29716372
Access Rights	open access
CopyRight	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.5026440.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Review of Scientific Instruments. 2018, 89(4), p. 043106
DC.title	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
DC.creator	Inoue, Takato
	Matsuyama, Satoshi
	Kawai, Shogo
	Yumoto, Hirokatsu
	Inubushi, Yuichi
	Osaka, Taito
	Inoue, Ichiro
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yabashi, Makina
	Ishikawa, Tetsuya
	Yamauchi, Kazuto
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2018-04-26
DC.identifier	https://doi.org/10.1063/1.5026440
DC.description	Takato Inoue, Satoshi Matsuyama, Shogo Kawai, Hirokatsu Yumoto, Yuichi Inubushi, Taito Osaka, Ichiro Inoue, Takahisa Koyama, Kensuke Tono, Haruhiko Ohashi, Makina Yabashi, Tetsuya Ishikawa, and Kazuto Yamauchi, "Systematic-error-free wavefront measurement using an X-ray single-grating interferometer", Review of Scientific Instruments 89, 043106 (2018), https://doi.org/10.1063/1.5026440.
DCTERMS.abstract	In this study, the systematic errors of an X-ray single-grating interferometer based on the Talbot effect were investigated in detail. Non-negligible systematic errors induced by an X-ray camera were identified and a method to eliminate the systematic error was proposed. Systematic-error-free measurements of the wavefront error produced by multilayer focusing mirrors with large numerical apertures were demonstrated at the SPring-8 Angstrom Compact free electron LAser. Consequently, wavefront aberration obtained with two different cameras was found to be consistent with an accuracy better than λ/12.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/1.5026440.
DC.format	86965
citation_title	Systematic-error-free wavefront measurement using an X-ray single-grating interferometer
citation_author	Inoue, Takato
	Matsuyama, Satoshi
	Kawai, Shogo
	Yumoto, Hirokatsu
	Inubushi, Yuichi
	Osaka, Taito
	Inoue, Ichiro
	Koyama, Takahisa
	Tono, Kensuke
	Ohashi, Haruhiko
	Yabashi, Makina
	Ishikawa, Tetsuya
	Yamauchi, Kazuto
citation_publisher	American Institute of Physics
citation_language	English
citation_date	2018-04-26
citation_journal_title	Review of Scientific Instruments
citation_volume	89
citation_issue	4
citation_firstpage	043106
citation_doi	https://doi.org/10.1063/1.5026440
citation_pmid	29716372
citation_public_url	https://hdl.handle.net/11094/86965

Systematic-error-free wavefront measurement using an X-ray single-grating interferometer

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