Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy

Takahashi, Yukio; Kubo, Hideto; Furukawa, Hayato; Yamauchi, Kazuto; Matsubara, Eiichiro; Ishikawa, Tetsuya; Nishino, Yoshinori

doi:https://doi.org/10.1088/1742-6596/186/1/012060

Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy

Takahashi, Yukio; Kubo, Hideto; Furukawa, Hayato et al.

Journal of Physics: Conference Series, 2009, 186, 012060

Number of Access:719（2025-08-15 10:58 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/86980

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Title	Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy
Creator	NRID 1000000415217 1000000415217 CreatorName Takahashi, Yukio
	CreatorName Kubo, Hideto
	CreatorName Furukawa, Hayato
	NRID 1000010174575 1000010174575 researchmap permalink yamauchikazuto yamauchikazuto Scopus Author ID 7801509680 7801509680 CreatorName Yamauchi, Kazuto
	NRID 1000090173864 1000090173864 CreatorName Matsubara, Eiichiro
	NRID 1000080159699 1000080159699 CreatorName Ishikawa, Tetsuya
	NRID 1000040392063 1000040392063 CreatorName Nishino, Yoshinori
Description	Takahashi Y., Kubo H., Furukawa H., et al. Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy. Journal of Physics: Conference Series, 186, , 012060. https://doi.org/10.1088/1742-6596/186/1/012060.
Description	9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 21–25 July 2008, Zürich, Switzerland
Abstract	An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed. © 2009 IOP Publishing Ltd.
Publisher	Institute of Physics Publishing
Source Title	Journal of Physics: Conference Series
Volume (Issue)	186
Page	012060
Date of Issued	2009-12-01
Language	English
Handle URL	https://hdl.handle.net/11094/86980
PISSN	17426588
eISSN	17426596
NCID	AA12839617
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1088/1742-6596/186/1/012060
Access Rights	open access
CopyRight	Published under licence in Journal of Physics: Conference Series by IOP Publishing Ltd. CC-BY Content from this work may be used under the terms of the Creative Commons Attribution 4.0 International licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
oaire:version	Version of Record
Category	会議発表論文 Conference Paper

Resource Type	conference paper
Local Type	Conference Paper
DCMI Type	Text
DCTERMS.bibliographicCitation	Journal of Physics: Conference Series. 2009, 186, p. 012060
DC.title	Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy
DC.creator	Takahashi, Yukio
	Kubo, Hideto
	Furukawa, Hayato
	Yamauchi, Kazuto
	Matsubara, Eiichiro
	Ishikawa, Tetsuya
	Nishino, Yoshinori
DC.publisher	Institute of Physics Publishing
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2009-12-01
DC.identifier	https://doi.org/10.1088/1742-6596/186/1/012060
DC.description	Takahashi Y., Kubo H., Furukawa H., et al. Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy. Journal of Physics: Conference Series, 186, , 012060. https://doi.org/10.1088/1742-6596/186/1/012060.
DC.description	9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY 21–25 July 2008, Zürich, Switzerland
DCTERMS.abstract	An incident X-ray flux monitor for coherent X-ray diffraction microscopy was developed. The intensities of x-rays passing through the sample were measured using an X-ray photodiode, with the simultaneous measurement of the X-ray diffraction intensities of the sample. As a result of the normalization of the X-ray diffraction intensities by the incident X-ray flux determined from the monitor, the fluctuation of the speckle intensities was successfully suppressed. © 2009 IOP Publishing Ltd.
DC.rights	Published under licence in Journal of Physics: Conference Series by IOP Publishing Ltd. CC-BY Content from this work may be used under the terms of the Creative Commons Attribution 4.0 International licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
DC.format	86980
citation_title	Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy
citation_author	Takahashi, Yukio
	Kubo, Hideto
	Furukawa, Hayato
	Yamauchi, Kazuto
	Matsubara, Eiichiro
	Ishikawa, Tetsuya
	Nishino, Yoshinori
citation_publisher	Institute of Physics Publishing
citation_language	English
citation_date	2009-12-01
citation_journal_title	Journal of Physics: Conference Series
citation_volume	186
citation_firstpage	012060
citation_doi	https://doi.org/10.1088/1742-6596/186/1/012060
citation_public_url	https://hdl.handle.net/11094/86980

Development of incident X-ray flux monitor for coherent X-ray diffraction microscopy

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