Hard x-ray intensity autocorrelation using direct two-photon absorption

Osaka, Taito; Inoue, Ichiro; Yamada, Jumpei et al.

Physical Review Research, 2022, 4(1), L012035

Number of Access:221（2025-05-05 13:53 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/89661

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Title
Hard x-ray intensity autocorrelation using direct two-photon absorption
Creator
NRID
1000070782887 1000070782887
CreatorName
Osaka, Taito
NRID
1000030783401 1000030783401
CreatorName
Inoue, Ichiro
NRID
1000010845027 1000010845027
researchmap permalink
J_Y190325 J_Y190325
CreatorName
Yamada, Jumpei
NRID
1000040506250 1000040506250
CreatorName
Inubushi, Yuichi
CreatorName
Matsumura, Shotaro
NRID
1000040252598 1000040252598
ORCID
0000-0002-1767-922X 0000-0002-1767-922X
researchmap permalink
read0042804 read0042804
Scopus Author ID
7402344818 7402344818
CreatorName
Sano, Yasuhisa
NRID
1000000353508 1000000353508
CreatorName
Tono, Kensuke
NRID
1000010174575 1000010174575
researchmap permalink
yamauchikazuto yamauchikazuto
Scopus Author ID
7801509680 7801509680
CreatorName
Yamauchi, Kazuto
NRID
1000030300883 1000030300883
CreatorName
Tamasaku, Kenji
NRID
1000000372144 1000000372144
CreatorName
Yabashi, Makina
Description
Osaka T., Inoue I., Yamada J., et al. Hard x-ray intensity autocorrelation using direct two-photon absorption. Physical Review Research, 4, 1, L012035. https://doi.org/10.1103/PhysRevResearch.4.L012035.
Abstract
An intensity autocorrelation measurement is demonstrated to characterize a pulse duration of 9-keV x-ray free-electron laser (XFEL) pulses from a split-delay optical (SDO) system with four-bounce silicon 220 reflections in each branch. XFEL pulse replicas with variable time delays are generated by the SDO system itself. High intensity of >2×1016W/cm2 achieved in a self-seeding operation and careful data analysis allow the measurement with direct two-photon absorption. The autocorrelation trace gave a duration of 7.6±0.8fs in full width at half maximum for a Gaussian assumption. Furthermore, the trace shows good agreement with a simulation of the XFEL pulse shape propagating through the SDO system, irrespective of spectral chirps in the original XFEL pulses. Our results open the door toward direct temporal characterization of narrowband XFELs at the hard x-ray regime, such as self-seeded and future cavity-based XFELs, and indicate a solid way for temporal tailoring of ultrafast x-ray pulses with perfect crystals.
Publisher
American Physical Society
Source Title
Physical Review Research
Volume (Issue)
4(1)
Page
L012035
Date of Issued
2022-03-18
Language
English
Handle URL
https://hdl.handle.net/11094/89661
PISSN
26431564
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1103/PhysRevResearch.4.L012035
Access Rights
open access
CopyRight
This article is licensed under a Creative Commons Attribution 4.0 International License.
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Category
学術雑誌論文 Journal Article