Magnetic-field and temperature dependence of anomalous Hall effect in Pt/Cr₂O₃/Pt trilayer

Wang, Xinrui; Toyoki, Kentaro; Nakatani, Ryoichi et al.

AIP Advances, 2022, 12(3), 035216

Number of Access:887（2025-08-14 01:38 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/89955

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Title
Magnetic-field and temperature dependence of anomalous Hall effect in Pt/Cr₂O₃/Pt trilayer
Creator
CreatorName
Wang, Xinrui
NRID
1000090780007 1000090780007
ORCID
0000-0003-2887-0326 0000-0003-2887-0326
researchmap permalink
k_toyoki k_toyoki
Scopus Author ID
55970429100 55970429100
CreatorName
Toyoki, Kentaro
NRID
1000060314374 1000060314374
researchmap permalink
read0068619 read0068619
Scopus Author ID
7005234924 7005234924
CreatorName
Nakatani, Ryoichi
NRID
1000070379121 1000070379121
ORCID
0000-0002-8938-4869 0000-0002-8938-4869
researchmap permalink
read0090304 read0090304
Scopus Author ID
6602197167 6602197167
CreatorName
Shiratsuchi, Yu
Description
Xinrui Wang, Kentaro Toyoki, Ryoichi Nakatani, and Yu Shiratsuchi, AIP Advances 12, 035216 (2022); https://doi.org/10.1063/9.0000253.
Abstract
The Pt/Cr₂O₃ interface exhibits a variety of spin-related phenomena. In this study, we investigated the anomalous Hall effect (AHE) of a Pt/40-nm-thick Cr₂O₃/Pt trilayer grown on Al₂O₃(0001), where Cr₂O₃ is an antiferromagnetic (AFM) insulator. All layers were grown epitaxially on the substrate, and X-ray reflectivity measurement showed an interfacial roughness of approximately 0.2 nm at each interface. The AHE resistance showed a nonlinear magnetic-field dependence at 300 K. Below 250 K, a clear hysteresis with coercivity was observed. The coercivity was approximately 7 T above 150 K and approximately 6 T below 100 K. The remanent AHE resistance shows a finite value below 285 K. The temperature dependence forms a broad peak with a maximum at approximately 200 K and gradually decreases with decreasing temperature. This temperature dependence is similar to that reported for the interfacial magnetic moment on Cr₂O₃(0001). Based on these results, the remanent AHE coupled with the AFM order parameter or the Néel vector was successfully detected in the 40-nm-thick Cr₂O₃ layer grown on the conductive layer.
Publisher
American Institute of Physics
Source Title
AIP Advances
Volume (Issue)
12(3)
Page
035216
Date of Issued
2022-03-09
Language
English
Handle URL
https://hdl.handle.net/11094/89955
eISSN
21583226
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1063/9.0000253
Access Rights
open access
CopyRight
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Xinrui Wang, Kentaro Toyoki, Ryoichi Nakatani, and Yu Shiratsuchi, AIP Advances 12, 035216 (2022) and may be found at https://doi.org/10.1063/9.0000253.
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Version of Record
Category
学術雑誌論文 Journal Article