Resistive detection of the Néel temperature of Cr₂O₃ thin films

Iino, Tatsuya; Moriyama, Takahiro; Iwaki, Hiroyuki; Aono, Hikaru; Shiratsuchi, Yu; Ono, Teruo

doi:https://doi.org/10.1063/1.5082220

Resistive detection of the Néel temperature of Cr₂O₃ thin films

Iino, Tatsuya; Moriyama, Takahiro; Iwaki, Hiroyuki et al.

Applied Physics Letters, 2019, 114(2), 022402

Number of Access:728（2025-11-20 11:33 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/89965

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Title	Resistive detection of the Néel temperature of Cr₂O₃ thin films
Creator	CreatorName Iino, Tatsuya
	NRID 1000050643326 1000050643326 CreatorName Moriyama, Takahiro
	CreatorName Iwaki, Hiroyuki
	CreatorName Aono, Hikaru
	NRID 1000070379121 1000070379121 ORCID 0000-0002-8938-4869 0000-0002-8938-4869 researchmap permalink read0090304 read0090304 Scopus Author ID 6602197167 6602197167 CreatorName Shiratsuchi, Yu
	NRID 1000090296749 1000090296749 CreatorName Ono, Teruo
Description	Tatsuya Iino, Takahiro Moriyama, Hiroyuki Iwaki, Hikaru Aono, Yu Shiratsuchi, and Teruo Ono, Appl. Phys. Lett. 114, 022402 (2019); https://doi.org/10.1063/1.5082220.
Abstract	Although bulk magnetic properties of various antiferromagnets have been vigorously studied since long ago, their properties in the form of thin films, which are more relevant to antiferromagnetic spintronic devices, have not been investigated as much. In this work, we characterized the Néel temperature of Cr₂O₃ thin films by investigating the temperature dependence of the spin Hall magnetoresistance in Cr₂O₃/Pt bilayers. A precise determination of the Néel temperature was made possible by carefully designing the direction of the magnetic anisotropy in Cr₂O₃. The results provide a reliable way to determine the Néel temperature of antiferromagnetic thin films.
Publisher	American Institute of Physics
Source Title	Applied Physics Letters
Volume (Issue)	114(2)
Page	022402
Date of Issued	2019-01-15
Language	English
Handle URL	https://hdl.handle.net/11094/89965
PISSN	00036951
NCID	AA00543431
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1063/1.5082220
Access Rights	open access
CopyRight	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Tatsuya Iino, Takahiro Moriyama, Hiroyuki Iwaki, Hikaru Aono, Yu Shiratsuchi, and Teruo Ono, Appl. Phys. Lett. 114, 022402 (2019) and may be found at https://doi.org/10.1063/1.5082220.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Applied Physics Letters. 2019, 114(2), p. 022402
DC.title	Resistive detection of the Néel temperature of Cr₂O₃ thin films
DC.creator	Iino, Tatsuya
	Moriyama, Takahiro
	Iwaki, Hiroyuki
	Aono, Hikaru
	Shiratsuchi, Yu
	Ono, Teruo
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2019-01-15
DC.identifier	https://doi.org/10.1063/1.5082220
DC.description	Tatsuya Iino, Takahiro Moriyama, Hiroyuki Iwaki, Hikaru Aono, Yu Shiratsuchi, and Teruo Ono, Appl. Phys. Lett. 114, 022402 (2019); https://doi.org/10.1063/1.5082220.
DCTERMS.abstract	Although bulk magnetic properties of various antiferromagnets have been vigorously studied since long ago, their properties in the form of thin films, which are more relevant to antiferromagnetic spintronic devices, have not been investigated as much. In this work, we characterized the Néel temperature of Cr₂O₃ thin films by investigating the temperature dependence of the spin Hall magnetoresistance in Cr₂O₃/Pt bilayers. A precise determination of the Néel temperature was made possible by carefully designing the direction of the magnetic anisotropy in Cr₂O₃. The results provide a reliable way to determine the Néel temperature of antiferromagnetic thin films.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Tatsuya Iino, Takahiro Moriyama, Hiroyuki Iwaki, Hikaru Aono, Yu Shiratsuchi, and Teruo Ono, Appl. Phys. Lett. 114, 022402 (2019) and may be found at https://doi.org/10.1063/1.5082220.
DC.format	89965
citation_title	Resistive detection of the Néel temperature of Cr₂O₃ thin films
citation_author	Iino, Tatsuya
	Moriyama, Takahiro
	Iwaki, Hiroyuki
	Aono, Hikaru
	Shiratsuchi, Yu
	Ono, Teruo
citation_publisher	American Institute of Physics
citation_language	English
citation_date	2019-01-15
citation_journal_title	Applied Physics Letters
citation_volume	114
citation_issue	2
citation_firstpage	022402
citation_doi	https://doi.org/10.1063/1.5082220
citation_public_url	https://hdl.handle.net/11094/89965

Resistive detection of the Néel temperature of Cr₂O₃ thin films

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