Frustration and relaxation of antiferromagnetic domains reversed by magneto-electric field cooling in a Pt/Co/Au/Cr₂O₃/Pt-stacked film

Shiratsuchi, Yu; Watanabe, Shunsuke; Yonemura, Shogo et al.

AIP Advances, 2018, 8(12), 125313

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Identifier to cite or link to this item: https://hdl.handle.net/11094/89970

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Title
Frustration and relaxation of antiferromagnetic domains reversed by magneto-electric field cooling in a Pt/Co/Au/Cr₂O₃/Pt-stacked film
Creator
NRID
1000070379121 1000070379121
ORCID
0000-0002-8938-4869 0000-0002-8938-4869
researchmap permalink
read0090304 read0090304
Scopus Author ID
6602197167 6602197167
CreatorName
Shiratsuchi, Yu
CreatorName
Watanabe, Shunsuke
CreatorName
Yonemura, Shogo
CreatorName
Shibata, Tatsuo
NRID
1000060314374 1000060314374
researchmap permalink
read0068619 read0068619
Scopus Author ID
7005234924 7005234924
CreatorName
Nakatani, Ryoichi
Description
Yu Shiratsuchi, Shunsuke Watanabe, Shogo Yonemura, Tatsuo Shibata, and Ryoichi Nakatani, AIP Advances 8, 125313 (2018); https://doi.org/10.1063/1.5053136.
Abstract
Using magnetic domain observations, we investigated the reversal process of the perpendicular exchange bias polarity resulting from the antiferromagnetic Cr₂O₃ domain reversal driven by magneto-electric field cooling (MEFC). The exchange bias polarity changed from negative to positive with increasing electric field during MEFC. The relevant change in the magnetic domain revealed the stochastic appearance of the reversed magnetic domains that exhibit the positive exchange bias. The local magnetization curves suggest that the antiferromagnetic domain state after MEFC was frustrated because of energy competition between the interfacial exchange coupling and the bulk magneto-electric effect. The frustrated nature of the magnetic domain structure is supported by the training effect of the exchange bias after MEFC.
Publisher
American Institute of Physics
Source Title
AIP Advances
Volume (Issue)
8(12)
Page
125313
Date of Issued
2018-12-06
Language
English
Handle URL
https://hdl.handle.net/11094/89970
eISSN
21583226
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.1063/1.5053136
Access Rights
open access
CopyRight
Copyright 2018 Author(s). This article is distributed under a Creative Commons Attribution (CC BY) License.
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Category
学術雑誌論文 Journal Article