Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

Shiratsuchi, Yu; Nakano, Yuuta; Inami, Nobuhito; Ueno, Tetsuro; Ono, Kanta; Kumai, Reiji; Sagayama, Ryoko; Nakatani, Ryoichi

doi:https://doi.org/10.1063/1.5020620

Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

Shiratsuchi, Yu; Nakano, Yuuta; Inami, Nobuhito et al.

Journal of Applied Physics, 2018, 123(10), 103903

Number of Access:539（2025-11-01 13:07 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/89972

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Title	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
Creator	NRID 1000070379121 1000070379121 ORCID 0000-0002-8938-4869 0000-0002-8938-4869 researchmap permalink read0090304 read0090304 Scopus Author ID 6602197167 6602197167 CreatorName Shiratsuchi, Yu
	CreatorName Nakano, Yuuta
	CreatorName Inami, Nobuhito
	NRID 1000020609747 1000020609747 CreatorName Ueno, Tetsuro
	NRID 1000070282572 1000070282572 ORCID 0000-0002-3285-9093 0000-0002-3285-9093 researchmap permalink onokanta onokanta Scopus Author ID 7403890224 7403890224 CreatorName Ono, Kanta
	NRID 1000000356924 1000000356924 CreatorName Kumai, Reiji
	CreatorName Sagayama, Ryoko
	NRID 1000060314374 1000060314374 researchmap permalink read0068619 read0068619 Scopus Author ID 7005234924 7005234924 CreatorName Nakatani, Ryoichi
Description	Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018); https://doi.org/10.1063/1.5020620.
Abstract	The structures of antiferromagnetic Cr₂O₃(0001) thin films with perpendicular exchange bias were investigated using reflection high-energy electron diffraction, X-ray reflectivity, and synchrotron X-ray diffraction. We mainly investigated the specific ion positions of Cr³⁺ and O²- in the corundum structure and discussed their relationship to the magnetic anisotropy of Cr₂O₃. The Cr₂O₃(0001) thin film grown on a Pt(111) buffer layer exhibited a perpendicular exchange anisotropy density of 0.42 mJ/m², in which the Cr³⁺ position is the primary factor in the enhancement of magnetic anisotropy due to dipolar-interaction. In contrast, the single-crystalline Cr₂O₃(0001) film grown on a α-Al₂O₃(0001) substrate featured a low exchange magnetic anisotropy of 0.098 mJ/m². In this film, the Cr³⁺ position parameter is an insignificant factor, leading to low magnetic anisotropy. The O²- ion position also differs between the two types of films, which can affect both the magnetic anisotropy energy originating from fine structures and the magneto-electric properties of Cr₂O₃.
Publisher	American Institute of Physics
Source Title	Journal of Applied Physics
Volume (Issue)	123(10)
Page	103903
Date of Issued	2018-03-14
Language	English
Handle URL	https://hdl.handle.net/11094/89972
PISSN	00218979
eISSN	10897550
NCID	AA00693547
Relation.isIdenticalTo	DOI (Publisher Version) https://doi.org/10.1063/1.5020620
Access Rights	open access
CopyRight	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018) and may be found at https://doi.org/10.1063/1.5020620.
oaire:version	Version of Record
Category	学術雑誌論文 Journal Article

Resource Type	journal article
Local Type	Journal Article
DCMI Type	Text
DCTERMS.bibliographicCitation	Journal of Applied Physics. 2018, 123(10), p. 103903
DC.title	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
DC.creator	Shiratsuchi, Yu
	Nakano, Yuuta
	Inami, Nobuhito
	Ueno, Tetsuro
	Ono, Kanta
	Kumai, Reiji
	Sagayama, Ryoko
	Nakatani, Ryoichi
DC.publisher	American Institute of Physics
DC.language' scheme='DCTERMS.RFC1766	English
DC.type' scheme='DCTERMS.DCMIType	Text
DCTERMS.issued' scheme='DCTERMS.W3CDTF	2018-03-14
DC.identifier	https://doi.org/10.1063/1.5020620
DC.description	Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018); https://doi.org/10.1063/1.5020620.
DCTERMS.abstract	The structures of antiferromagnetic Cr₂O₃(0001) thin films with perpendicular exchange bias were investigated using reflection high-energy electron diffraction, X-ray reflectivity, and synchrotron X-ray diffraction. We mainly investigated the specific ion positions of Cr³⁺ and O²- in the corundum structure and discussed their relationship to the magnetic anisotropy of Cr₂O₃. The Cr₂O₃(0001) thin film grown on a Pt(111) buffer layer exhibited a perpendicular exchange anisotropy density of 0.42 mJ/m², in which the Cr³⁺ position is the primary factor in the enhancement of magnetic anisotropy due to dipolar-interaction. In contrast, the single-crystalline Cr₂O₃(0001) film grown on a α-Al₂O₃(0001) substrate featured a low exchange magnetic anisotropy of 0.098 mJ/m². In this film, the Cr³⁺ position parameter is an insignificant factor, leading to low magnetic anisotropy. The O²- ion position also differs between the two types of films, which can affect both the magnetic anisotropy energy originating from fine structures and the magneto-electric properties of Cr₂O₃.
DC.rights	This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Yu Shiratsuchi, Yuuta Nakano, Nobuhito Inami, Tetsuro Ueno, Kanta Ono, Reiji Kumai, Ryoko Sagayama, and Ryoichi Nakatani, Journal of Applied Physics 123, 103903 (2018) and may be found at https://doi.org/10.1063/1.5020620.
DC.format	89972
citation_title	Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces
citation_author	Shiratsuchi, Yu
	Nakano, Yuuta
	Inami, Nobuhito
	Ueno, Tetsuro
	Ono, Kanta
	Kumai, Reiji
	Sagayama, Ryoko
	Nakatani, Ryoichi
citation_publisher	American Institute of Physics
citation_language	English
citation_date	2018-03-14
citation_journal_title	Journal of Applied Physics
citation_volume	123
citation_issue	10
citation_firstpage	103903
citation_doi	https://doi.org/10.1063/1.5020620
citation_public_url	https://hdl.handle.net/11094/89972

Determination of specific ion positions of Cr³⁺ and O²- in Cr₂O₃ thin films and their relationship to exchange anisotropy at Co/Cr₂O₃ interfaces

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