Hybrid mode atomic force microscopy of phase modulation and frequency modulation

Yamamoto, Tatsuya; Miyazaki, Masato; Nomura, Hikaru et al.

Microscopy, 2023, 72(3), 236-242

Number of Access:631（2025-08-14 02:24 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/93978

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Title
Hybrid mode atomic force microscopy of phase modulation and frequency modulation
Creator
CreatorName
Yamamoto, Tatsuya
CreatorName
Miyazaki, Masato
NRID
1000020506258 1000020506258
CreatorName
Nomura, Hikaru
NRID
1000050379137 1000050379137
researchmap permalink
liyanjun50379137 liyanjun50379137
Scopus Author ID
35558743600 35558743600
CreatorName
Li, Yan Jun
NRID
1000040206404 1000040206404
researchmap permalink
read0082006 read0082006
Scopus Author ID
7201773028 7201773028
CreatorName
Sugawara, Yasuhiro
Subject
atomic force microscopy
frequency modulation
hybrid mode
phase modulation
Description
This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Yamamoto T., Miyazaki M., Nomura H., et al. Hybrid mode atomic force microscopy of phase modulation and frequency modulation. 72(3), 236-242 1 June 2023 is available online at: https://doi.org/10.1093/jmicro/dfac057.
Abstract
We propose hybrid phase modulation (PM)/frequency modulation (FM) atomic force microscopy (AFM) to increase the imaging speed of AFM in high-Q environments. We derive the relationship between the phase shift, the frequency shift and the tip-sample interaction force from the equation of motion for the cantilever in high-Q environments. The tip-sample conservative force is approximately given by the sum of the conservative force with respect to the phase shift in the PM mode and that with respect to the frequency shift in the FM mode. We preliminarily demonstrate that the hybrid PM/FM-AFM is a new and very promising AFM operation mode that can increase imaging speed.
Publisher
Oxford University Press
Source Title
Microscopy
Volume (Issue)
72(3)
Page
236-242
Date of Issued
2023-06-01
Language
English
Handle URL
https://hdl.handle.net/11094/93978
PISSN
20505698
eISSN
20505701
Relation.isVersionOf
DOI (Publisher Version)
https://doi.org/10.1093/jmicro/dfac057
Access Rights
open access
CopyRight
© 2022 The Author(s). Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved.
oaire:version
Accepted Manuscript
Category
学術雑誌論文 Journal Article