Athermal Crystal Defect Dynamics in Si Revealed by Cryo-High-Voltage Electron Microscopy

Sato, Kazuhisa; Yasuda, Hidehiro

ACS Omega, 2020, 5(3), 1457-1462

Number of Access:932025-06-07 13:24 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/97374

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