最新超高圧電子顕微鏡法による厚膜組織解析と高速その場観察

佐藤, 和久

まてりあ, 2024, 63(4), 236-242

Number of Access:255（2025-08-14 12:35 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/100854

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Title
最新超高圧電子顕微鏡法による厚膜組織解析と高速その場観察
Creator
NRID
1000070314424 1000070314424
ORCID
0000-0001-9078-2541 0000-0001-9078-2541
researchmap permalink
read0158304 read0158304
Scopus Author ID
55552977400 55552977400
CreatorName
佐藤, 和久 ; サトウ, カズヒサ ; Sato, Kazuhisa
Subject
high-voltage electron microscopy
maximum usable thickness
crystal defects
threading dislocations
in-situ observation
cryo-electron microscopy
direct electron detection camera
Description
佐藤 和久, 最新超高圧電子顕微鏡法による厚膜組織解析と高速その場観察, まてりあ, 2024, 63 巻, 4 号, p. 236-242, https://doi.org/10.2320/materia.63.236
Publisher
日本金属学会
Japan Institute of Metals
Source Title
まてりあ
Materia Japan
Volume (Issue)
63(4)
Page
236-242
Date of Issued
2024-04-01
Language
Japanese
Handle URL
https://hdl.handle.net/11094/100854
PISSN
13402625
eISSN
18845843
NCID
AN10433227
Relation.isIdenticalTo
DOI (Publisher Version)
https://doi.org/10.2320/materia.63.236
Access Rights
open access
oaire:version
Version of Record
Category
学術雑誌論文 Journal Article